Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method

Y. Z. Fang, D. Jayasuriya, David Furniss, Z. Q. Tang, Michal Sojka, Christos Markos, Slawomir Sujecki, Angela B. Seddon, Trevor M. Benson

Research output: Contribution to journalJournal articleResearchpeer-review

403 Downloads (Pure)

Abstract

The well-known method presented by Swanepoel can be used to determine the refractive index dispersion of thin films in the near-infrared region from wavelength values at maxima and minima, only, of the transmission interference fringes. In order to extend this method into the mid-infrared spectral region (our measurements are over the wavelength range from 2 to 25 µm), the method is improved by using a two-term Sellmeier model instead of the Cauchy model as the dispersive equation. Chalcogenide thin films of nominal batch composition As40Se60 (at.%) and Ge16As24Se15.5Te44.5 (at.%) are prepared by a hot-pressing technique. The refractive index dispersion of the chalcogenide thin films is determined by the improved method with a standard deviation of less than 0.0027. The accuracy of the method is shown to be better than 0.4% at a wavelength of 3.1 µm by comparison with a benchmark refractive index value obtained from prism measurements on Ge16As24Se15.5Te44.5 material taken from the same batch.
Original languageEnglish
Article number237
JournalOptical and Quantum Electronics
Volume49
Issue number7
Number of pages19
ISSN0306-8919
DOIs
Publication statusPublished - 2017

Keywords

  • Chalcogenide glasses
  • Refractive index
  • Dispersion

Cite this

Fang, Y. Z. ; Jayasuriya, D. ; Furniss, David ; Tang, Z. Q. ; Sojka, Michal ; Markos, Christos ; Sujecki, Slawomir ; Seddon, Angela B. ; Benson, Trevor M. / Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method. In: Optical and Quantum Electronics. 2017 ; Vol. 49, No. 7.
@article{6df3ecf8556a444db5d76e5183806b31,
title = "Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method",
abstract = "The well-known method presented by Swanepoel can be used to determine the refractive index dispersion of thin films in the near-infrared region from wavelength values at maxima and minima, only, of the transmission interference fringes. In order to extend this method into the mid-infrared spectral region (our measurements are over the wavelength range from 2 to 25{\^A} {\^A}µm), the method is improved by using a two-term Sellmeier model instead of the Cauchy model as the dispersive equation. Chalcogenide thin films of nominal batch composition As40Se60 (at.{\%}) and Ge16As24Se15.5Te44.5 (at.{\%}) are prepared by a hot-pressing technique. The refractive index dispersion of the chalcogenide thin films is determined by the improved method with a standard deviation of less than 0.0027. The accuracy of the method is shown to be better than 0.4{\%} at a wavelength of 3.1{\^A} {\^A}µm by comparison with a benchmark refractive index value obtained from prism measurements on Ge16As24Se15.5Te44.5 material taken from the same batch.",
keywords = "Chalcogenide glasses, Refractive index, Dispersion",
author = "Fang, {Y. Z.} and D. Jayasuriya and David Furniss and Tang, {Z. Q.} and Michal Sojka and Christos Markos and Slawomir Sujecki and Seddon, {Angela B.} and Benson, {Trevor M.}",
year = "2017",
doi = "10.1007/s11082-017-1057-9",
language = "English",
volume = "49",
journal = "Optical and Quantum Electronics",
issn = "0306-8919",
publisher = "Springer New York",
number = "7",

}

Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method. / Fang, Y. Z.; Jayasuriya, D.; Furniss, David; Tang, Z. Q.; Sojka, Michal; Markos, Christos; Sujecki, Slawomir; Seddon, Angela B.; Benson, Trevor M.

In: Optical and Quantum Electronics, Vol. 49, No. 7, 237, 2017.

Research output: Contribution to journalJournal articleResearchpeer-review

TY - JOUR

T1 - Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method

AU - Fang, Y. Z.

AU - Jayasuriya, D.

AU - Furniss, David

AU - Tang, Z. Q.

AU - Sojka, Michal

AU - Markos, Christos

AU - Sujecki, Slawomir

AU - Seddon, Angela B.

AU - Benson, Trevor M.

PY - 2017

Y1 - 2017

N2 - The well-known method presented by Swanepoel can be used to determine the refractive index dispersion of thin films in the near-infrared region from wavelength values at maxima and minima, only, of the transmission interference fringes. In order to extend this method into the mid-infrared spectral region (our measurements are over the wavelength range from 2 to 25 µm), the method is improved by using a two-term Sellmeier model instead of the Cauchy model as the dispersive equation. Chalcogenide thin films of nominal batch composition As40Se60 (at.%) and Ge16As24Se15.5Te44.5 (at.%) are prepared by a hot-pressing technique. The refractive index dispersion of the chalcogenide thin films is determined by the improved method with a standard deviation of less than 0.0027. The accuracy of the method is shown to be better than 0.4% at a wavelength of 3.1 µm by comparison with a benchmark refractive index value obtained from prism measurements on Ge16As24Se15.5Te44.5 material taken from the same batch.

AB - The well-known method presented by Swanepoel can be used to determine the refractive index dispersion of thin films in the near-infrared region from wavelength values at maxima and minima, only, of the transmission interference fringes. In order to extend this method into the mid-infrared spectral region (our measurements are over the wavelength range from 2 to 25 µm), the method is improved by using a two-term Sellmeier model instead of the Cauchy model as the dispersive equation. Chalcogenide thin films of nominal batch composition As40Se60 (at.%) and Ge16As24Se15.5Te44.5 (at.%) are prepared by a hot-pressing technique. The refractive index dispersion of the chalcogenide thin films is determined by the improved method with a standard deviation of less than 0.0027. The accuracy of the method is shown to be better than 0.4% at a wavelength of 3.1 µm by comparison with a benchmark refractive index value obtained from prism measurements on Ge16As24Se15.5Te44.5 material taken from the same batch.

KW - Chalcogenide glasses

KW - Refractive index

KW - Dispersion

U2 - 10.1007/s11082-017-1057-9

DO - 10.1007/s11082-017-1057-9

M3 - Journal article

VL - 49

JO - Optical and Quantum Electronics

JF - Optical and Quantum Electronics

SN - 0306-8919

IS - 7

M1 - 237

ER -