Determining grain resolved stresses in polycrystalline materials using three-dimensional X-ray diffraction

Jette Oddershede, Søren Schmidt, Henning Friis Poulsen, Henning Osholm Sørensen, Jonathan Wright, Walter Reimers

    Research output: Contribution to journalJournal articleResearchpeer-review

    Abstract

    An algorithm is presented for characterization of the grain resolved (type II) stress states in a polycrystalline sample based on monochromatic X-ray diffraction data. The algorithm is a robust 12-parameter-per-grain fit of the centre-of-mass grain positions, orientations and stress tensors including error estimation and outlier rejection. The algorithm is validated by simulations and by two experiments on interstitial free steel. In the first experiment, using only a far-field detector and a rotation range of 2 × 110°, 96 grains in one layer were monitored during elastic loading and unloading. Very consistent results were obtained, with mean resolutions for each grain of approximately 10 µm in position, 0.05° in orientation, and 8, 20 and 13 × 10-5 in the axial, normal and shear components of the strain, respectively. The corresponding mean deviations in stress are 30, 50 and 15 MPa in the axial, normal and shear components, respectively, though some grains may have larger errors. In the second experiment, where a near-field detector was added, ~ 2000 grains were characterized with a positional accuracy of 3 µm.
    Original languageEnglish
    JournalJournal of Applied Crystallography
    Volume43
    Issue number3
    Pages (from-to)539-549
    ISSN0021-8898
    DOIs
    Publication statusPublished - 2010

    Keywords

    • Materials characterization and modelling
    • Materials and energy storage

    Cite this

    @article{2ff2727d4fb44342a6b97f8f657f4512,
    title = "Determining grain resolved stresses in polycrystalline materials using three-dimensional X-ray diffraction",
    abstract = "An algorithm is presented for characterization of the grain resolved (type II) stress states in a polycrystalline sample based on monochromatic X-ray diffraction data. The algorithm is a robust 12-parameter-per-grain fit of the centre-of-mass grain positions, orientations and stress tensors including error estimation and outlier rejection. The algorithm is validated by simulations and by two experiments on interstitial free steel. In the first experiment, using only a far-field detector and a rotation range of 2 × 110°, 96 grains in one layer were monitored during elastic loading and unloading. Very consistent results were obtained, with mean resolutions for each grain of approximately 10 µm in position, 0.05° in orientation, and 8, 20 and 13 × 10-5 in the axial, normal and shear components of the strain, respectively. The corresponding mean deviations in stress are 30, 50 and 15 MPa in the axial, normal and shear components, respectively, though some grains may have larger errors. In the second experiment, where a near-field detector was added, ~ 2000 grains were characterized with a positional accuracy of 3 µm.",
    keywords = "Materials characterization and modelling, Materials and energy storage, Materialekarakterisering og materialemodellering, Materialer og energilagring",
    author = "Jette Oddershede and S{\o}ren Schmidt and Poulsen, {Henning Friis} and S{\o}rensen, {Henning Osholm} and Jonathan Wright and Walter Reimers",
    year = "2010",
    doi = "10.1107/S0021889810012963",
    language = "English",
    volume = "43",
    pages = "539--549",
    journal = "Journal of Applied Crystallography",
    issn = "0021-8898",
    publisher = "Wiley-Blackwell",
    number = "3",

    }

    Determining grain resolved stresses in polycrystalline materials using three-dimensional X-ray diffraction. / Oddershede, Jette; Schmidt, Søren; Poulsen, Henning Friis; Sørensen, Henning Osholm; Wright, Jonathan; Reimers, Walter.

    In: Journal of Applied Crystallography, Vol. 43, No. 3, 2010, p. 539-549.

    Research output: Contribution to journalJournal articleResearchpeer-review

    TY - JOUR

    T1 - Determining grain resolved stresses in polycrystalline materials using three-dimensional X-ray diffraction

    AU - Oddershede, Jette

    AU - Schmidt, Søren

    AU - Poulsen, Henning Friis

    AU - Sørensen, Henning Osholm

    AU - Wright, Jonathan

    AU - Reimers, Walter

    PY - 2010

    Y1 - 2010

    N2 - An algorithm is presented for characterization of the grain resolved (type II) stress states in a polycrystalline sample based on monochromatic X-ray diffraction data. The algorithm is a robust 12-parameter-per-grain fit of the centre-of-mass grain positions, orientations and stress tensors including error estimation and outlier rejection. The algorithm is validated by simulations and by two experiments on interstitial free steel. In the first experiment, using only a far-field detector and a rotation range of 2 × 110°, 96 grains in one layer were monitored during elastic loading and unloading. Very consistent results were obtained, with mean resolutions for each grain of approximately 10 µm in position, 0.05° in orientation, and 8, 20 and 13 × 10-5 in the axial, normal and shear components of the strain, respectively. The corresponding mean deviations in stress are 30, 50 and 15 MPa in the axial, normal and shear components, respectively, though some grains may have larger errors. In the second experiment, where a near-field detector was added, ~ 2000 grains were characterized with a positional accuracy of 3 µm.

    AB - An algorithm is presented for characterization of the grain resolved (type II) stress states in a polycrystalline sample based on monochromatic X-ray diffraction data. The algorithm is a robust 12-parameter-per-grain fit of the centre-of-mass grain positions, orientations and stress tensors including error estimation and outlier rejection. The algorithm is validated by simulations and by two experiments on interstitial free steel. In the first experiment, using only a far-field detector and a rotation range of 2 × 110°, 96 grains in one layer were monitored during elastic loading and unloading. Very consistent results were obtained, with mean resolutions for each grain of approximately 10 µm in position, 0.05° in orientation, and 8, 20 and 13 × 10-5 in the axial, normal and shear components of the strain, respectively. The corresponding mean deviations in stress are 30, 50 and 15 MPa in the axial, normal and shear components, respectively, though some grains may have larger errors. In the second experiment, where a near-field detector was added, ~ 2000 grains were characterized with a positional accuracy of 3 µm.

    KW - Materials characterization and modelling

    KW - Materials and energy storage

    KW - Materialekarakterisering og materialemodellering

    KW - Materialer og energilagring

    U2 - 10.1107/S0021889810012963

    DO - 10.1107/S0021889810012963

    M3 - Journal article

    VL - 43

    SP - 539

    EP - 549

    JO - Journal of Applied Crystallography

    JF - Journal of Applied Crystallography

    SN - 0021-8898

    IS - 3

    ER -