Determination of the interfacial roughness exponent in rare-earth superlattices

P.P. Swaddling; D.F. McMorrow; R.A. Cowley; R.C.C. Ward; M.R. Wells

doi:10.1103/PhysRevLett.73.2232

Determination of the interfacial roughness exponent in rare-earth superlattices

P.P. Swaddling, D.F. McMorrow, R.A. Cowley, R.C.C. Ward, M.R. Wells

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Abstract

The interfacial roughness in Ho/Y and Ho/Lu superlattices has been studied using high-resolution x-ray diffraction. The transverse width of the superlattice Bragg peaks broadens almost linearly as a function of the component of the reduced wave vector parallel to the growth direction, while the line shape is invariant, and is described by a Lorentzian raised to the power of approximate to 5/2. These results are interpreted as a signature of conformally rough interfaces, and the roughness exponent is determined to be alpha = 0.85 +/- 0.05. It is also shown how alpha may be altered by adjusting the growth conditions.

Original language	English
Journal	Physical Review Letters
Volume	73
Issue number	16
Pages (from-to)	2232-2235
ISSN	0031-9007
DOIs	https://doi.org/10.1103/PhysRevLett.73.2232
Publication status	Published - 1994

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title = "Determination of the interfacial roughness exponent in rare-earth superlattices",

abstract = "The interfacial roughness in Ho/Y and Ho/Lu superlattices has been studied using high-resolution x-ray diffraction. The transverse width of the superlattice Bragg peaks broadens almost linearly as a function of the component of the reduced wave vector parallel to the growth direction, while the line shape is invariant, and is described by a Lorentzian raised to the power of approximate to 5/2. These results are interpreted as a signature of conformally rough interfaces, and the roughness exponent is determined to be alpha = 0.85 +/- 0.05. It is also shown how alpha may be altered by adjusting the growth conditions. ",

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author = "P.P. Swaddling and D.F. McMorrow and R.A. Cowley and R.C.C. Ward and M.R. Wells",

year = "1994",

doi = "10.1103/PhysRevLett.73.2232",

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T1 - Determination of the interfacial roughness exponent in rare-earth superlattices

AU - Swaddling, P.P.

AU - McMorrow, D.F.

AU - Cowley, R.A.

AU - Ward, R.C.C.

AU - Wells, M.R.

PY - 1994

Y1 - 1994

N2 - The interfacial roughness in Ho/Y and Ho/Lu superlattices has been studied using high-resolution x-ray diffraction. The transverse width of the superlattice Bragg peaks broadens almost linearly as a function of the component of the reduced wave vector parallel to the growth direction, while the line shape is invariant, and is described by a Lorentzian raised to the power of approximate to 5/2. These results are interpreted as a signature of conformally rough interfaces, and the roughness exponent is determined to be alpha = 0.85 +/- 0.05. It is also shown how alpha may be altered by adjusting the growth conditions.

AB - The interfacial roughness in Ho/Y and Ho/Lu superlattices has been studied using high-resolution x-ray diffraction. The transverse width of the superlattice Bragg peaks broadens almost linearly as a function of the component of the reduced wave vector parallel to the growth direction, while the line shape is invariant, and is described by a Lorentzian raised to the power of approximate to 5/2. These results are interpreted as a signature of conformally rough interfaces, and the roughness exponent is determined to be alpha = 0.85 +/- 0.05. It is also shown how alpha may be altered by adjusting the growth conditions.

KW - Materialer med særlige fysiske og kemiske egenskaber

U2 - 10.1103/PhysRevLett.73.2232

DO - 10.1103/PhysRevLett.73.2232

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EP - 2235

JO - Physical Review Letters

JF - Physical Review Letters

IS - 16

ER -

Determination of the interfacial roughness exponent in rare-earth superlattices

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