Determination of the interfacial roughness exponent in rare-earth superlattices

P.P. Swaddling, D.F. McMorrow, R.A. Cowley, R.C.C. Ward, M.R. Wells

    Research output: Contribution to journalJournal articleResearch

    Abstract

    The interfacial roughness in Ho/Y and Ho/Lu superlattices has been studied using high-resolution x-ray diffraction. The transverse width of the superlattice Bragg peaks broadens almost linearly as a function of the component of the reduced wave vector parallel to the growth direction, while the line shape is invariant, and is described by a Lorentzian raised to the power of approximate to 5/2. These results are interpreted as a signature of conformally rough interfaces, and the roughness exponent is determined to be alpha = 0.85 +/- 0.05. It is also shown how alpha may be altered by adjusting the growth conditions.
    Original languageEnglish
    JournalPhysical Review Letters
    Volume73
    Issue number16
    Pages (from-to)2232-2235
    ISSN0031-9007
    DOIs
    Publication statusPublished - 1994

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