Determination of radiation tolerance of crystalline ZIF-8 metal organic framework in atomic scale EM experiments

Pritam Banerjee; Kathrin L. Kollmannsberger; Roland A. Fischer; Joerg Jinschek

Determination of radiation tolerance of crystalline ZIF-8 metal organic framework in atomic scale EM experiments

Pritam Banerjee, Kathrin L. Kollmannsberger, Roland A. Fischer, Joerg Jinschek

Technical University of Munich

Research output: Contribution to conference › Conference abstract for conference › Research › peer-review

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Abstract

A thorough understanding of structure-property correlations at the nm scale is essential for the development of nanomaterials’ application. In general, high-resolution scanning and transmission electron microscopy (HR-S/TEM) can be used to achieve this as it can provide atomic scale resolution. On the other hand, using high-energy electrons as probe for structural characterization and for probing nanoscale properties could be invasive when nanomaterial is sensitive [1]. Therefore, it is important to study the radiation effects caused by the electrons in HR-S/TEM experiments, eg. to estimate the total critical dose the sample can tolerate in order to maintain structural integrity.

Original language	English
Publication date	2023
Number of pages	2
Publication status	Published - 2023
Event	73rd Annual Meeting of the Nordic Microscopy Society - Ångström, Uppsala, Sweden Duration: 12 Jun 2023 → 15 Jun 2023 Conference number: 73 https://user.it.uu.se/~idsin102/SCANDEM2023/

Conference

Conference	73rd Annual Meeting of the Nordic Microscopy Society
Number	73
Country/Territory	Sweden
City	Ångström, Uppsala
Period	12/06/2023 → 15/06/2023
Internet address	https://user.it.uu.se/~idsin102/SCANDEM2023/

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@conference{327771a577d14df5a42eefeef721c87b,

title = "Determination of radiation tolerance of crystalline ZIF-8 metal organic framework in atomic scale EM experiments",

abstract = "A thorough understanding of structure-property correlations at the nm scale is essential for the development of nanomaterials{\textquoteright} application. In general, high-resolution scanning and transmission electron microscopy (HR-S/TEM) can be used to achieve this as it can provide atomic scale resolution. On the other hand, using high-energy electrons as probe for structural characterization and for probing nanoscale properties could be invasive when nanomaterial is sensitive [1]. Therefore, it is important to study the radiation effects caused by the electrons in HR-S/TEM experiments, eg. to estimate the total critical dose the sample can tolerate in order to maintain structural integrity.",

author = "Pritam Banerjee and Kollmannsberger, {Kathrin L.} and Fischer, {Roland A.} and Joerg Jinschek",

year = "2023",

language = "English",

note = "73rd Annual Meeting of the Nordic Microscopy Society, SCANDEM 2023 ; Conference date: 12-06-2023 Through 15-06-2023",

url = "https://user.it.uu.se/~idsin102/SCANDEM2023/",

}

Determination of radiation tolerance of crystalline ZIF-8 metal organic framework in atomic scale EM experiments. / Banerjee, Pritam; Kollmannsberger, Kathrin L.; Fischer, Roland A. et al.
2023. Abstract from 73rd Annual Meeting of the Nordic Microscopy Society, Ångström, Uppsala, Sweden.

Research output: Contribution to conference › Conference abstract for conference › Research › peer-review

TY - ABST

T1 - Determination of radiation tolerance of crystalline ZIF-8 metal organic framework in atomic scale EM experiments

AU - Banerjee, Pritam

AU - Kollmannsberger, Kathrin L.

AU - Fischer, Roland A.

AU - Jinschek, Joerg

N1 - Conference code: 73

PY - 2023

Y1 - 2023

N2 - A thorough understanding of structure-property correlations at the nm scale is essential for the development of nanomaterials’ application. In general, high-resolution scanning and transmission electron microscopy (HR-S/TEM) can be used to achieve this as it can provide atomic scale resolution. On the other hand, using high-energy electrons as probe for structural characterization and for probing nanoscale properties could be invasive when nanomaterial is sensitive [1]. Therefore, it is important to study the radiation effects caused by the electrons in HR-S/TEM experiments, eg. to estimate the total critical dose the sample can tolerate in order to maintain structural integrity.

AB - A thorough understanding of structure-property correlations at the nm scale is essential for the development of nanomaterials’ application. In general, high-resolution scanning and transmission electron microscopy (HR-S/TEM) can be used to achieve this as it can provide atomic scale resolution. On the other hand, using high-energy electrons as probe for structural characterization and for probing nanoscale properties could be invasive when nanomaterial is sensitive [1]. Therefore, it is important to study the radiation effects caused by the electrons in HR-S/TEM experiments, eg. to estimate the total critical dose the sample can tolerate in order to maintain structural integrity.

M3 - Conference abstract for conference

T2 - 73rd Annual Meeting of the Nordic Microscopy Society

Y2 - 12 June 2023 through 15 June 2023

ER -

Determination of radiation tolerance of crystalline ZIF-8 metal organic framework in atomic scale EM experiments

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