Determination of radiation tolerance of crystalline ZIF-8 metal organic framework in atomic scale EM experiments

Pritam Banerjee, Kathrin L. Kollmannsberger, Roland A. Fischer, Joerg Jinschek

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Abstract

A thorough understanding of structure-property correlations at the nm scale is essential for the development of nanomaterials’ application. In general, high-resolution scanning and transmission electron microscopy (HR-S/TEM) can be used to achieve this as it can provide atomic scale resolution. On the other hand, using high-energy electrons as probe for structural characterization and for probing nanoscale properties could be invasive when nanomaterial is sensitive [1]. Therefore, it is important to study the radiation effects caused by the electrons in HR-S/TEM experiments, eg. to estimate the total critical dose the sample can tolerate in order to maintain structural integrity.
Original languageEnglish
Publication date2023
Number of pages2
Publication statusPublished - 2023
Event73rd Annual Meeting of the Nordic Microscopy Society - Ångström, Uppsala, Sweden
Duration: 12 Jun 202315 Jun 2023
Conference number: 73
https://user.it.uu.se/~idsin102/SCANDEM2023/

Conference

Conference73rd Annual Meeting of the Nordic Microscopy Society
Number73
Country/TerritorySweden
CityÅngström, Uppsala
Period12/06/202315/06/2023
Internet address

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