Abstract
A methodology is proposed combining the scattering vector method with energy dispersive diffraction for the non-destructive determination of stress- and composition-depth profiles. The advantage of the present method is a relatively short measurement time and avoidance of tedious sublayer removal; the disadvantage as compared to destructive methods is that depth profiles can only be obtained for depth shallower than half the layer thickness. The proposed method is applied to an expanded austenite layer on stainless steel and allows the separation of stress, composition and stacking fault density gradients.
Original language | English |
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Journal | Thin solid Films |
Volume | 530 |
Pages (from-to) | 71-76 |
ISSN | 0040-6090 |
DOIs | |
Publication status | Published - 2013 |
Event | 6th Size-Strain International Conference Diffraction analysis of the microstructure of materials - Presqu'ile de Giens, France Duration: 17 Oct 2011 → 20 Oct 2011 Conference number: 6 |
Conference
Conference | 6th Size-Strain International Conference Diffraction analysis of the microstructure of materials |
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Number | 6 |
Country | France |
City | Presqu'ile de Giens |
Period | 17/10/2011 → 20/10/2011 |
Keywords
- Surface engineering
- Residual stress
- Energy-dispersive diffraction
- Reconstruction profile