Detection of Solar Cell Cracks by Laser Line Induced Lateral Currents and Luminescence Imaging

Gisele Alves dos Reis Benatto*, Adrian Alejo Santamaria Lancia, Thøger Kari Hass, Peter Behrensdorff Poulsen, Sergiu Spataru

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

    Abstract

    Electroluminescence imaging is a very powerful technique for PV fault diagnosis, although having to contact electrically the panels during measurement is a complex and time demanding limitation that currently presents a challenge for wide scale field inspections. A light induced luminescence method has the potential to overcome the contacting issue, generating contactless luminescence based PV images. With this technique, a concentrated light beam that will induce lateral currents generates the luminescence signal. The spatially resolved luminescence appears differently in regions of the solar cell with high resistivity, such as electrically isolated cracks. In this paper, we evaluate how the different aspects of the light induced lateral currents are shown in cracks with different severity levels, compared with a non-electrically isolated area, and a control cell in the same PV module. Moreover, the influence of laser intensity and scanning orientation are evaluated.
    Original languageEnglish
    Title of host publicationProceedings of 37th European Photovoltaic Solar Energy Conference and Exhibition
    Publication date2020
    Pages1053-1057
    ISBN (Print)3-936338-73-6
    DOIs
    Publication statusPublished - 2020
    Event37th European Photovoltaic Solar Energy Conference and Exhibition - Virtual event
    Duration: 7 Sep 202011 Sep 2020
    Conference number: 37
    https://www.photovoltaic-conference.com/

    Conference

    Conference37th European Photovoltaic Solar Energy Conference and Exhibition
    Number37
    LocationVirtual event
    Period07/09/202011/09/2020
    Internet address

    Keywords

    • Electroluminescence
    • Photoluminescence
    • Fault detection
    • Reliability

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