Detection of Potential Induced Degradation in c-Si PV Panels Using Electrical Impedance Spectroscopy

Matei-lon Oprea; Sergiu Spataru; Dezso Sera; Ronni Basu; Anders R. Andersen; Peter Behrensdorff Poulsen

Detection of Potential Induced Degradation in c-Si PV Panels Using Electrical Impedance Spectroscopy

Matei-lon Oprea
, Sergiu Spataru
, Dezso Sera
, Ronni Basu
, Anders R. Andersen
, Peter Behrensdorff Poulsen

Research output: Contribution to conference › Poster › Research › peer-review

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Abstract

This work, for the first time, investigates an Impedance Spectroscopy (IS) based method for detecting potential-induced degradation (PID) in crystalline silicon photovoltaic (c-Si PV) panels. The method has been experimentally tested on a set of panels that were confirmed to be affected by PID by using traditional current-voltage (I-V) characterization methods, as well as electroluminescence (EL) imaging. The results confirm the effectiveness of the new approach to detect PID in PV panels.

Original language	English
Publication date	2016
Number of pages	1
Publication status	Published - 2016
Event	42nd IEEE Photovoltaic Specialists Conference - Hyatt Regency, New Orleans, United States Duration: 14 Jun 2015 → 19 Jun 2015 Conference number: 42 http://www.ieee-pvsc.org/PVSC42/

Conference

Conference	42nd IEEE Photovoltaic Specialists Conference
Number	42
Location	Hyatt Regency
Country/Territory	United States
City	New Orleans
Period	14/06/2015 → 19/06/2015
Internet address	http://www.ieee-pvsc.org/PVSC42/

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@conference{e8cf3aa20dd64c638397c2cfffae5e38,

title = "Detection of Potential Induced Degradation in c-Si PV Panels Using Electrical Impedance Spectroscopy",

abstract = "This work, for the first time, investigates an Impedance Spectroscopy (IS) based method for detecting potential-induced degradation (PID) in crystalline silicon photovoltaic (c-Si PV) panels. The method has been experimentally tested on a set of panels that were confirmed to be affected by PID by using traditional current-voltage (I-V) characterization methods, as well as electroluminescence (EL) imaging. The results confirm the effectiveness of the new approach to detect PID in PV panels.",

author = "Matei-lon Oprea and Sergiu Spataru and Dezso Sera and Ronni Basu and Andersen, \{Anders R.\} and Poulsen, \{Peter Behrensdorff\}",

year = "2016",

language = "English",

note = "42nd IEEE Photovoltaic Specialists Conference, PVSC 2015 ; Conference date: 14-06-2015 Through 19-06-2015",

url = "http://www.ieee-pvsc.org/PVSC42/",

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TY - CONF

T1 - Detection of Potential Induced Degradation in c-Si PV Panels Using Electrical Impedance Spectroscopy

AU - Oprea, Matei-lon

AU - Spataru, Sergiu

AU - Sera, Dezso

AU - Basu, Ronni

AU - Andersen, Anders R.

AU - Poulsen, Peter Behrensdorff

N1 - Conference code: 42

PY - 2016

Y1 - 2016

N2 - This work, for the first time, investigates an Impedance Spectroscopy (IS) based method for detecting potential-induced degradation (PID) in crystalline silicon photovoltaic (c-Si PV) panels. The method has been experimentally tested on a set of panels that were confirmed to be affected by PID by using traditional current-voltage (I-V) characterization methods, as well as electroluminescence (EL) imaging. The results confirm the effectiveness of the new approach to detect PID in PV panels.

AB - This work, for the first time, investigates an Impedance Spectroscopy (IS) based method for detecting potential-induced degradation (PID) in crystalline silicon photovoltaic (c-Si PV) panels. The method has been experimentally tested on a set of panels that were confirmed to be affected by PID by using traditional current-voltage (I-V) characterization methods, as well as electroluminescence (EL) imaging. The results confirm the effectiveness of the new approach to detect PID in PV panels.

M3 - Poster

T2 - 42nd IEEE Photovoltaic Specialists Conference

Y2 - 14 June 2015 through 19 June 2015

ER -

Detection of Potential Induced Degradation in c-Si PV Panels Using Electrical Impedance Spectroscopy

Abstract

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