Detection of Potential Induced Degradation in c-Si PV Panels Using Electrical Impedance Spectroscopy

Matei-lon Oprea, Sergiu Spataru, Dezso Sera, Ronni Basu, Anders R. Andersen, Peter Behrensdorff Poulsen

Research output: Contribution to conferencePosterResearchpeer-review

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Abstract

This work, for the first time, investigates an Impedance Spectroscopy (IS) based method for detecting potential-induced degradation (PID) in crystalline silicon photovoltaic (c-Si PV) panels. The method has been experimentally tested on a set of panels that were confirmed to be affected by PID by using traditional current-voltage (I-V) characterization methods, as well as electroluminescence (EL) imaging. The results confirm the effectiveness of the new approach to detect PID in PV panels.
Original languageEnglish
Publication date2016
Number of pages1
Publication statusPublished - 2016
Event42nd IEEE Photovoltaic Specialists Conference - Hyatt Regency, New Orleans, United States
Duration: 14 Jun 201519 Jun 2015
Conference number: 42
http://www.ieee-pvsc.org/PVSC42/

Conference

Conference42nd IEEE Photovoltaic Specialists Conference
Number42
LocationHyatt Regency
CountryUnited States
CityNew Orleans
Period14/06/201519/06/2015
Internet address

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