Detection of Potential Induced Degradation in c-Si PV Panels Using Electrical Impedance Spectroscopy

Matei-lon Oprea, Sergiu Spataru, Dezso Sera, Ronni Basu, Anders R. Andersen, Peter Behrensdorff Poulsen

    Research output: Contribution to conferencePosterResearchpeer-review

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    Abstract

    This work, for the first time, investigates an Impedance Spectroscopy (IS) based method for detecting potential-induced degradation (PID) in crystalline silicon photovoltaic (c-Si PV) panels. The method has been experimentally tested on a set of panels that were confirmed to be affected by PID by using traditional current-voltage (I-V) characterization methods, as well as electroluminescence (EL) imaging. The results confirm the effectiveness of the new approach to detect PID in PV panels.
    Original languageEnglish
    Publication date2016
    Number of pages1
    Publication statusPublished - 2016
    Event42nd IEEE Photovoltaic Specialists Conference - Hyatt Regency, New Orleans, United States
    Duration: 14 Jun 201519 Jun 2015
    Conference number: 42
    http://www.ieee-pvsc.org/PVSC42/

    Conference

    Conference42nd IEEE Photovoltaic Specialists Conference
    Number42
    LocationHyatt Regency
    Country/TerritoryUnited States
    CityNew Orleans
    Period14/06/201519/06/2015
    Internet address

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