Detection of Potential Induced Degradation in c-Si PV Panels Using Electrical Impedance Spectroscopy

Matei-lon Oprea, Sergiu Spataru, Dezso Sera, Ronni Basu, Anders Andersen, Peter Behrensdorff Poulsen, Sune Thorsteinsson

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review


    Impedance spectroscopy (IS) is an established characterization method in different electrical and chemical research areas, but not yet adopted as a commercial diagnostic tool for PV panels. This work, for the first time, proposes an IS based method for detecting potential-induced degradation (PID) in c-Si PV panels. The method has been experimentally tested using an automated PID test bed, and the IS results were confirmed using traditional current-voltage characterization methods, as well as electroluminescence imaging. The corroborated results confirm the effectiveness of the new approach to identify PID in PV panels.
    Original languageEnglish
    Title of host publication43rd IEEE Photovoltaic Specialist Conference
    Publication date2016
    ISBN (Print)9781509027248
    Publication statusPublished - 2016
    Event2016 IEEE 43rd Photovoltaic Specialists Conference - Oregon Convention Center, Portland, United States
    Duration: 5 Jun 201610 Jun 2016
    Conference number: 43


    Conference2016 IEEE 43rd Photovoltaic Specialists Conference
    LocationOregon Convention Center
    Country/TerritoryUnited States
    Internet address


    • c-Si PV panel
    • Impedance spectroscopy
    • Potential induced degradation
    • AC modelling
    • Parameter fitting
    • Current-voltage characterization
    • Electroluminescence imaging


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