Abstract
Impedance spectroscopy (IS) is an established characterization method in different electrical and chemical research areas, but not yet adopted as a commercial diagnostic tool for PV panels. This work, for the first time, proposes an IS based method for detecting potential-induced degradation (PID) in c-Si PV panels. The method has been experimentally tested using an automated PID test bed, and the IS results were confirmed using traditional current-voltage characterization methods, as well as electroluminescence imaging. The corroborated results confirm the effectiveness of the new approach to identify PID in PV panels.
Original language | English |
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Title of host publication | 43rd IEEE Photovoltaic Specialist Conference |
Publisher | IEEE |
Publication date | 2016 |
Pages | 1575-1579 |
ISBN (Print) | 9781509027248 |
DOIs | |
Publication status | Published - 2016 |
Event | 2016 IEEE 43rd Photovoltaic Specialists Conference - Oregon Convention Center, Portland, United States Duration: 5 Jun 2016 → 10 Jun 2016 Conference number: 43 https://ieeexplore.ieee.org/xpl/conhome/7701171/proceeding |
Conference
Conference | 2016 IEEE 43rd Photovoltaic Specialists Conference |
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Number | 43 |
Location | Oregon Convention Center |
Country/Territory | United States |
City | Portland |
Period | 05/06/2016 → 10/06/2016 |
Internet address |
Keywords
- c-Si PV panel
- Impedance spectroscopy
- Potential induced degradation
- AC modelling
- Parameter fitting
- Current-voltage characterization
- Electroluminescence imaging