Detection of Potential Induced Degradation in c-Si PV Panels Using Electrical Impedance Spectroscopy

Matei-lon Oprea; Sergiu Spataru; Dezso Sera; Ronni Basu; Anders Andersen; Peter Behrensdorff Poulsen; Sune Thorsteinsson

doi:10.1109/PVSC.2016.7749885

Detection of Potential Induced Degradation in c-Si PV Panels Using Electrical Impedance Spectroscopy

Matei-lon Oprea, Sergiu Spataru, Dezso Sera, Ronni Basu, Anders Andersen, Peter Behrensdorff Poulsen, Sune Thorsteinsson

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

Abstract

Impedance spectroscopy (IS) is an established characterization method in different electrical and chemical research areas, but not yet adopted as a commercial diagnostic tool for PV panels. This work, for the first time, proposes an IS based method for detecting potential-induced degradation (PID) in c-Si PV panels. The method has been experimentally tested using an automated PID test bed, and the IS results were confirmed using traditional current-voltage characterization methods, as well as electroluminescence imaging. The corroborated results confirm the effectiveness of the new approach to identify PID in PV panels.

Original language	English
Title of host publication	43rd IEEE Photovoltaic Specialist Conference
Publisher	IEEE
Publication date	2016
Pages	1575-1579
ISBN (Print)	9781509027248
DOIs	https://doi.org/10.1109/PVSC.2016.7749885
Publication status	Published - 2016
Event	2016 IEEE 43rd Photovoltaic Specialists Conference - Oregon Convention Center, Portland, United States Duration: 5 Jun 2016 → 10 Jun 2016 Conference number: 43 https://ieeexplore.ieee.org/xpl/conhome/7701171/proceeding

Conference

Conference	2016 IEEE 43rd Photovoltaic Specialists Conference
Number	43
Location	Oregon Convention Center
Country/Territory	United States
City	Portland
Period	05/06/2016 → 10/06/2016
Internet address	https://ieeexplore.ieee.org/xpl/conhome/7701171/proceeding

Keywords

c-Si PV panel
Impedance spectroscopy
Potential induced degradation
AC modelling
Parameter fitting
Current-voltage characterization
Electroluminescence imaging

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10.1109/PVSC.2016.7749885

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@inproceedings{3f2fcea8ca3647c0b374ae8a806b6424,

title = "Detection of Potential Induced Degradation in c-Si PV Panels Using Electrical Impedance Spectroscopy",

abstract = "Impedance spectroscopy (IS) is an established characterization method in different electrical and chemical research areas, but not yet adopted as a commercial diagnostic tool for PV panels. This work, for the first time, proposes an IS based method for detecting potential-induced degradation (PID) in c-Si PV panels. The method has been experimentally tested using an automated PID test bed, and the IS results were confirmed using traditional current-voltage characterization methods, as well as electroluminescence imaging. The corroborated results confirm the effectiveness of the new approach to identify PID in PV panels.",

keywords = "c-Si PV panel, Impedance spectroscopy, Potential induced degradation, AC modelling, Parameter fitting, Current-voltage characterization, Electroluminescence imaging",

author = "Matei-lon Oprea and Sergiu Spataru and Dezso Sera and Ronni Basu and Anders Andersen and Poulsen, {Peter Behrensdorff} and Sune Thorsteinsson",

year = "2016",

doi = "10.1109/PVSC.2016.7749885",

language = "English",

isbn = "9781509027248",

pages = "1575--1579",

booktitle = "43rd IEEE Photovoltaic Specialist Conference",

publisher = "IEEE",

address = "United States",

note = "2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016 ; Conference date: 05-06-2016 Through 10-06-2016",

url = "https://ieeexplore.ieee.org/xpl/conhome/7701171/proceeding",

}

Oprea, M, Spataru, S, Sera, D, Basu, R, Andersen, A, Poulsen, PB & Thorsteinsson, S 2016, Detection of Potential Induced Degradation in c-Si PV Panels Using Electrical Impedance Spectroscopy. in 43rd IEEE Photovoltaic Specialist Conference. IEEE, pp. 1575-1579, 2016 IEEE 43rd Photovoltaic Specialists Conference, Portland, Oregon, United States, 05/06/2016. https://doi.org/10.1109/PVSC.2016.7749885

TY - GEN

T1 - Detection of Potential Induced Degradation in c-Si PV Panels Using Electrical Impedance Spectroscopy

AU - Oprea, Matei-lon

AU - Spataru, Sergiu

AU - Sera, Dezso

AU - Basu, Ronni

AU - Andersen, Anders

AU - Poulsen, Peter Behrensdorff

AU - Thorsteinsson, Sune

N1 - Conference code: 43

PY - 2016

Y1 - 2016

N2 - Impedance spectroscopy (IS) is an established characterization method in different electrical and chemical research areas, but not yet adopted as a commercial diagnostic tool for PV panels. This work, for the first time, proposes an IS based method for detecting potential-induced degradation (PID) in c-Si PV panels. The method has been experimentally tested using an automated PID test bed, and the IS results were confirmed using traditional current-voltage characterization methods, as well as electroluminescence imaging. The corroborated results confirm the effectiveness of the new approach to identify PID in PV panels.

AB - Impedance spectroscopy (IS) is an established characterization method in different electrical and chemical research areas, but not yet adopted as a commercial diagnostic tool for PV panels. This work, for the first time, proposes an IS based method for detecting potential-induced degradation (PID) in c-Si PV panels. The method has been experimentally tested using an automated PID test bed, and the IS results were confirmed using traditional current-voltage characterization methods, as well as electroluminescence imaging. The corroborated results confirm the effectiveness of the new approach to identify PID in PV panels.

KW - c-Si PV panel

KW - Impedance spectroscopy

KW - Potential induced degradation

KW - AC modelling

KW - Parameter fitting

KW - Current-voltage characterization

KW - Electroluminescence imaging

U2 - 10.1109/PVSC.2016.7749885

DO - 10.1109/PVSC.2016.7749885

M3 - Article in proceedings

SN - 9781509027248

SP - 1575

EP - 1579

BT - 43rd IEEE Photovoltaic Specialist Conference

PB - IEEE

T2 - 2016 IEEE 43rd Photovoltaic Specialists Conference

Y2 - 5 June 2016 through 10 June 2016

ER -

Detection of Potential Induced Degradation in c-Si PV Panels Using Electrical Impedance Spectroscopy

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