Detection of Potential Induced Degradation in c-Si PV Panels Using Electrical Impedance Spectroscopy

Matei-lon Oprea, Sergiu Spataru, Dezso Sera, Ronni Basu, Anders Andersen, Peter Behrensdorff Poulsen, Sune Thorsteinsson

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Abstract

Impedance spectroscopy (IS) is an established characterization method in different electrical and chemical research areas, but not yet adopted as a commercial diagnostic tool for PV panels. This work, for the first time, proposes an IS based method for detecting potential-induced degradation (PID) in c-Si PV panels. The method has been experimentally tested using an automated PID test bed, and the IS results were confirmed using traditional current-voltage characterization methods, as well as electroluminescence imaging. The corroborated results confirm the effectiveness of the new approach to identify PID in PV panels.
Original languageEnglish
Title of host publication43rd IEEE Photovoltaic Specialist Conference
PublisherIEEE
Publication date2016
Pages1575-1579
ISBN (Print)9781509027248
DOIs
Publication statusPublished - 2016
EventIEEE 43rd Photovoltaic Specialist Conference - Oregon Convention Center, Portland, United States
Duration: 5 Jun 201610 Jun 2016

Conference

ConferenceIEEE 43rd Photovoltaic Specialist Conference
LocationOregon Convention Center
CountryUnited States
CityPortland
Period05/06/201610/06/2016

Keywords

  • c-Si PV panel
  • Impedance spectroscopy
  • Potential induced degradation
  • AC modelling
  • Parameter fitting
  • Current-voltage characterization
  • Electroluminescence imaging

Cite this

Oprea, M., Spataru, S., Sera, D., Basu, R., Andersen, A., Poulsen, P. B., & Thorsteinsson, S. (2016). Detection of Potential Induced Degradation in c-Si PV Panels Using Electrical Impedance Spectroscopy. In 43rd IEEE Photovoltaic Specialist Conference (pp. 1575-1579). IEEE. https://doi.org/10.1109/PVSC.2016.7749885