Design and Surface Synchrotron X-ray Structure Analysis of Langmuir Films for Crystal Nucleation

E.M. Landau, S. Grayer Wolf, J. Sagiv, M. Deutsch, K. Kjær, J. Als-Nielsen, L. Leiserowitz, M. Lahav

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@article{34fb0d15c1e343d09685059e761ff4c2,

title = "Design and Surface Synchrotron X-ray Structure Analysis of Langmuir Films for Crystal Nucleation",

author = "E.M. Landau and {Grayer Wolf}, S. and J. Sagiv and M. Deutsch and K. Kj{\ae}r and J. Als-Nielsen and L. Leiserowitz and M. Lahav",

year = "1989",

doi = "10.1351/pac198961040673",

language = "English",

volume = "61",

pages = "673--684",

journal = "Pure and Applied Chemistry",

issn = "0033-4545",

publisher = "Walterde Gruyter GmbH",

number = "4",

}

TY - JOUR

T1 - Design and Surface Synchrotron X-ray Structure Analysis of Langmuir Films for Crystal Nucleation

AU - Landau, E.M.

AU - Grayer Wolf, S.

AU - Sagiv, J.

AU - Deutsch, M.

AU - Kjær, K.

AU - Als-Nielsen, J.

AU - Leiserowitz, L.

AU - Lahav, M.

PY - 1989

Y1 - 1989

U2 - 10.1351/pac198961040673

DO - 10.1351/pac198961040673

M3 - Journal article

SN - 0033-4545

VL - 61

SP - 673

EP - 684

JO - Pure and Applied Chemistry

JF - Pure and Applied Chemistry

IS - 4

ER -