Design and performance verification of a wideband scalable dual-polarized probe for spherical near-field antenna measurements

Sergey Pivnenko, Oleksiy S. Kim, Jeppe Majlund Nielsen, Olav Breinbjerg

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    Abstract

    A wideband scalable dual-polarized probe designed by the Electromagnetic Systems group at the Technical University of Denmark is presented. The design was scaled and two probes were manufactured for the frequency bands 1-3 GHz and 0.4-1.2 GHz. The results of the acceptance tests of the 0.4-1.2 GHz probe are briefly discussed. Since these probes represent so-called higher-order antennas, applicability of the recently developed higher-order probe correction technique [3] for these probes was investigated. Extensive tests were carried out for two representative antennas under test using the manufactured probes; the results of these tests are presented and discussed in details.
    Original languageEnglish
    Title of host publicationProceedings of the 34th Annual Symposium of the Antenna Measurement Techniques Association
    Number of pages6
    Publication date2012
    Publication statusPublished - 2012
    Event34th Annual Symposium of the Antenna Measurement Techniques Association - Bellevue, WA, United States
    Duration: 21 Oct 201226 Oct 2012

    Conference

    Conference34th Annual Symposium of the Antenna Measurement Techniques Association
    Country/TerritoryUnited States
    CityBellevue, WA
    Period21/10/201226/10/2012

    Keywords

    • Dual-Polarized Probe
    • Wideband Probe
    • Spherical Near-Field Measurements
    • Uncertainties

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