Abstract
A wideband scalable dual-polarized probe designed by the Electromagnetic Systems group at the Technical University of Denmark is presented. The design was scaled and two probes were manufactured for the frequency bands 1-3 GHz and 0.4-1.2 GHz. The results of the acceptance tests of the 0.4-1.2 GHz probe are briefly discussed. Since these probes represent so-called higher-order antennas, applicability of the recently developed higher-order probe correction technique [3] for these probes was investigated. Extensive tests were carried out for two representative antennas under test using the manufactured probes; the results of these tests are presented and discussed in details.
Original language | English |
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Title of host publication | Proceedings of the 34th Annual Symposium of the Antenna Measurement Techniques Association |
Number of pages | 6 |
Publication date | 2012 |
Publication status | Published - 2012 |
Event | 34th Annual Symposium of the Antenna Measurement Techniques Association - Bellevue, WA, United States Duration: 21 Oct 2012 → 26 Oct 2012 |
Conference
Conference | 34th Annual Symposium of the Antenna Measurement Techniques Association |
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Country/Territory | United States |
City | Bellevue, WA |
Period | 21/10/2012 → 26/10/2012 |
Keywords
- Dual-Polarized Probe
- Wideband Probe
- Spherical Near-Field Measurements
- Uncertainties