Original language | English |
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Journal | Applied Physics A: Materials Science & Processing |
Volume | 27 |
Issue number | 4 |
Pages (from-to) | 183-195 |
ISSN | 0947-8396 |
DOIs | |
Publication status | Published - 1982 |
Depth Profiling by Ion-Beam Spectrometry
P Børgesen, R. Behrisch, B.M.U. Scherzer
Research output: Contribution to journal › Journal article › Research › peer-review