Deposition of highly oriented (K,Na)NbO3 films on flexible metal substrates

Jean-Claude Grivel; Karl  Thydén; Jacob R. Bowen; Astri Bjørnetun Haugen

doi:10.1016/j.tsf.2018.02.008

Deposition of highly oriented (K,Na)NbO₃ films on flexible metal substrates

Jean-Claude Grivel^*, Karl Thydén, Jacob R. Bowen, Astri Bjørnetun Haugen

^*Corresponding author for this work

Department of Energy Conversion and Storage

Research output: Contribution to journal › Journal article › Research › peer-review

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Abstract

In view of developing flexible, highly textured Pb-free piezoelectric thin films, (K,Na)NbO₃ was deposited by chemical solution deposition on cube-textured Ni-W alloy substrates. After heat treatment, a strong (001)_pc out-of-plane preferential orientation is created in the (K,Na)NbO₃ layer, which also exhibits a sharp in-plane texture with 45°-rotated epitaxial relation to the substrate. The microstructure of the film is strongly dependent on the heat treatment temperature; sub-micrometer grains versus up to 2 μm long particles forming at 600 °C and 900 °C respectively. K₄Nb₆O₁₇ and (K_1−xNa_x)₂Nb₄O₁₁ impurity phases were identified depending on the processing temperature.

Original language	English
Journal	Thin Solid Films
Volume	650
Pages (from-to)	7-10
ISSN	0040-6090
DOIs	https://doi.org/10.1016/j.tsf.2018.02.008
Publication status	Published - 2018

Keywords

Piezoelectric materials
Thin films
Sol-gel preparation
Texture

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10.1016/j.tsf.2018.02.008

TSF D 17 01894 Revised manuscriptAccepted author manuscript, 292 KBLicence: CC BY-NC-ND

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Cite this

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title = "Deposition of highly oriented (K,Na)NbO3 films on flexible metal substrates",

abstract = "In view of developing flexible, highly textured Pb-free piezoelectric thin films, (K,Na)NbO3 was deposited by chemical solution deposition on cube-textured Ni-W alloy substrates. After heat treatment, a strong (001)pc out-of-plane preferential orientation is created in the (K,Na)NbO3 layer, which also exhibits a sharp in-plane texture with 45°-rotated epitaxial relation to the substrate. The microstructure of the film is strongly dependent on the heat treatment temperature; sub-micrometer grains versus up to 2 μm long particles forming at 600 °C and 900 °C respectively. K4Nb6O17 and (K1−xNax)2Nb4O11 impurity phases were identified depending on the processing temperature.",

keywords = "Piezoelectric materials, Thin films, Sol-gel preparation, Texture",

author = "Jean-Claude Grivel and Karl Thyd{\'e}n and Bowen, {Jacob R.} and {Bj{\o}rnetun Haugen}, Astri",

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AU - Grivel, Jean-Claude

AU - Thydén, Karl

AU - Bowen, Jacob R.

AU - Bjørnetun Haugen, Astri

PY - 2018

Y1 - 2018

N2 - In view of developing flexible, highly textured Pb-free piezoelectric thin films, (K,Na)NbO3 was deposited by chemical solution deposition on cube-textured Ni-W alloy substrates. After heat treatment, a strong (001)pc out-of-plane preferential orientation is created in the (K,Na)NbO3 layer, which also exhibits a sharp in-plane texture with 45°-rotated epitaxial relation to the substrate. The microstructure of the film is strongly dependent on the heat treatment temperature; sub-micrometer grains versus up to 2 μm long particles forming at 600 °C and 900 °C respectively. K4Nb6O17 and (K1−xNax)2Nb4O11 impurity phases were identified depending on the processing temperature.

AB - In view of developing flexible, highly textured Pb-free piezoelectric thin films, (K,Na)NbO3 was deposited by chemical solution deposition on cube-textured Ni-W alloy substrates. After heat treatment, a strong (001)pc out-of-plane preferential orientation is created in the (K,Na)NbO3 layer, which also exhibits a sharp in-plane texture with 45°-rotated epitaxial relation to the substrate. The microstructure of the film is strongly dependent on the heat treatment temperature; sub-micrometer grains versus up to 2 μm long particles forming at 600 °C and 900 °C respectively. K4Nb6O17 and (K1−xNax)2Nb4O11 impurity phases were identified depending on the processing temperature.

KW - Piezoelectric materials

KW - Thin films

KW - Sol-gel preparation

KW - Texture

U2 - 10.1016/j.tsf.2018.02.008

DO - 10.1016/j.tsf.2018.02.008

M3 - Journal article

SN - 0040-6090

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JO - Thin Solid Films

JF - Thin Solid Films

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