Abstract
W/Si and Co/C multilayers have been deposited on epoxy- replicated Au mirrors from the ASTRO-E telescope project, SPectrum Roentgen Gamma (SRG) flight mirrors, DURAN glass substrates and Si witness wafers. A characterization of the multilayers with both hard x-rays and soft x-rays is presented. The roughness value obtained from the Si wafers and the DURAN glass are in the range 3.0-4.2 angstrom and 4.4-4.6 angstrom, respectively. For the epoxy-replicated Au mirrors roughnesses of 5.0-5.8 angstrom are achieved, while the roughness of the SRG flight mirrors are in the range of 8.5-11.0 angstrom. This clearly indicates the effectiveness of the epoxy-replication process for the production of smooth substrates for multilayer deposition to be used in future x-ray telescopes.
Original language | English |
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Journal | Proceedings of S P I E - International Society for Optical Engineering |
Volume | 2805 |
Pages (from-to) | 336-342 |
ISSN | 0277-786X |
DOIs | |
Publication status | Published - 1996 |
Event | Multilayer and Grazing Incidence X-Ray/EUV Optics III - Denver, CO., United States Duration: 4 Aug 1996 → 4 Aug 1996 |
Conference
Conference | Multilayer and Grazing Incidence X-Ray/EUV Optics III |
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Country | United States |
City | Denver, CO. |
Period | 04/08/1996 → 04/08/1996 |
Keywords
- Characterization
- Metal foil
- Multilayers
- Optical glass
- Silicon wafers
- Space research
- Telescopes
- X rays
- Mirrors
- X