Deposition and characterization of multilayers on thin foil x-ray mirrors for high-throughput x-ray telescopes

Ahsen M. Hussain; Karsten D. Joensen; P. Hoeghoej; Finn Erland Christensen; Eric Louis; Harm-Jan Voorma; Yang Soong; Nicholas E. White; Ian Anderson; Richard B. Hoover; Arthur B.Jr. Walker; Richard B. Hoover; Arthur B.Jr. Walker

doi:10.1117/12.245113

Deposition and characterization of multilayers on thin foil x-ray mirrors for high-throughput x-ray telescopes

Ahsen M. Hussain, Karsten D. Joensen, P. Hoeghoej, Finn Erland Christensen, Eric Louis, Harm-Jan Voorma, Yang Soong, Nicholas E. White, Ian Anderson, Richard B. Hoover, Arthur B.Jr. Walker, Richard B. Hoover, Arthur B.Jr. Walker

National Space Institute

Research output: Contribution to journal › Conference article › Research › peer-review

Abstract

W/Si and Co/C multilayers have been deposited on epoxy- replicated Au mirrors from the ASTRO-E telescope project, SPectrum Roentgen Gamma (SRG) flight mirrors, DURAN glass substrates and Si witness wafers. A characterization of the multilayers with both hard x-rays and soft x-rays is presented. The roughness value obtained from the Si wafers and the DURAN glass are in the range 3.0-4.2 angstrom and 4.4-4.6 angstrom, respectively. For the epoxy-replicated Au mirrors roughnesses of 5.0-5.8 angstrom are achieved, while the roughness of the SRG flight mirrors are in the range of 8.5-11.0 angstrom. This clearly indicates the effectiveness of the epoxy-replication process for the production of smooth substrates for multilayer deposition to be used in future x-ray telescopes.

Original language	English
Journal	Proceedings of S P I E - International Society for Optical Engineering
Volume	2805
Pages (from-to)	336-342
ISSN	0277-786X
DOIs	https://doi.org/10.1117/12.245113
Publication status	Published - 1996
Event	Multilayer and Grazing Incidence X-Ray/EUV Optics III - Denver, CO., United States Duration: 4 Aug 1996 → 4 Aug 1996

Conference

Conference	Multilayer and Grazing Incidence X-Ray/EUV Optics III
Country	United States
City	Denver, CO.
Period	04/08/1996 → 04/08/1996

Keywords

Characterization
Metal foil
Multilayers
Optical glass
Silicon wafers
Space research
Telescopes
X rays
Mirrors
X

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Hussain, A. M., Joensen, K. D., Hoeghoej, P., Christensen, F. E., Louis, E., Voorma, H-J., Soong, Y., White, N. E., Anderson, I., Hoover, R. B., Walker, A. B. J., Hoover, R. B., & Walker, A. B. J. (1996). Deposition and characterization of multilayers on thin foil x-ray mirrors for high-throughput x-ray telescopes. Proceedings of S P I E - International Society for Optical Engineering, 2805, 336-342. https://doi.org/10.1117/12.245113

Hussain, Ahsen M. ; Joensen, Karsten D. ; Hoeghoej, P. ; Christensen, Finn Erland ; Louis, Eric ; Voorma, Harm-Jan ; Soong, Yang ; White, Nicholas E. ; Anderson, Ian ; Hoover, Richard B. ; Walker, Arthur B.Jr. ; Hoover, Richard B. ; Walker, Arthur B.Jr. / Deposition and characterization of multilayers on thin foil x-ray mirrors for high-throughput x-ray telescopes. In: Proceedings of S P I E - International Society for Optical Engineering. 1996 ; Vol. 2805. pp. 336-342.

@inproceedings{876a61b19ccc4f48a0aea77b949979bb,

title = "Deposition and characterization of multilayers on thin foil x-ray mirrors for high-throughput x-ray telescopes",

abstract = "W/Si and Co/C multilayers have been deposited on epoxy- replicated Au mirrors from the ASTRO-E telescope project, SPectrum Roentgen Gamma (SRG) flight mirrors, DURAN glass substrates and Si witness wafers. A characterization of the multilayers with both hard x-rays and soft x-rays is presented. The roughness value obtained from the Si wafers and the DURAN glass are in the range 3.0-4.2 angstrom and 4.4-4.6 angstrom, respectively. For the epoxy-replicated Au mirrors roughnesses of 5.0-5.8 angstrom are achieved, while the roughness of the SRG flight mirrors are in the range of 8.5-11.0 angstrom. This clearly indicates the effectiveness of the epoxy-replication process for the production of smooth substrates for multilayer deposition to be used in future x-ray telescopes.",

keywords = "Characterization, Metal foil, Multilayers, Optical glass, Silicon wafers, Space research, Telescopes, X rays, Mirrors, X",

author = "Hussain, {Ahsen M.} and Joensen, {Karsten D.} and P. Hoeghoej and Christensen, {Finn Erland} and Eric Louis and Harm-Jan Voorma and Yang Soong and White, {Nicholas E.} and Ian Anderson and Hoover, {Richard B.} and Walker, {Arthur B.Jr.} and Hoover, {Richard B.} and Walker, {Arthur B.Jr.}",

year = "1996",

doi = "10.1117/12.245113",

language = "English",

volume = "2805",

pages = "336--342",

journal = "Proceedings of SPIE, the International Society for Optical Engineering",

issn = "0277-786X",

publisher = "International Society for Optical Engineering",

note = "Multilayer and Grazing Incidence X-Ray/EUV Optics III ; Conference date: 04-08-1996 Through 04-08-1996",

}

Hussain, AM, Joensen, KD, Hoeghoej, P, Christensen, FE, Louis, E, Voorma, H-J, Soong, Y, White, NE, Anderson, I, Hoover, RB, Walker, ABJ, Hoover, RB & Walker, ABJ 1996, 'Deposition and characterization of multilayers on thin foil x-ray mirrors for high-throughput x-ray telescopes', Proceedings of S P I E - International Society for Optical Engineering, vol. 2805, pp. 336-342. https://doi.org/10.1117/12.245113

Deposition and characterization of multilayers on thin foil x-ray mirrors for high-throughput x-ray telescopes. / Hussain, Ahsen M.; Joensen, Karsten D.; Hoeghoej, P.; Christensen, Finn Erland; Louis, Eric; Voorma, Harm-Jan; Soong, Yang; White, Nicholas E.; Anderson, Ian; Hoover, Richard B.; Walker, Arthur B.Jr.; Hoover, Richard B.; Walker, Arthur B.Jr.

In: Proceedings of S P I E - International Society for Optical Engineering, Vol. 2805, 1996, p. 336-342.

Research output: Contribution to journal › Conference article › Research › peer-review

TY - GEN

T1 - Deposition and characterization of multilayers on thin foil x-ray mirrors for high-throughput x-ray telescopes

AU - Hussain, Ahsen M.

AU - Joensen, Karsten D.

AU - Hoeghoej, P.

AU - Christensen, Finn Erland

AU - Louis, Eric

AU - Voorma, Harm-Jan

AU - Soong, Yang

AU - White, Nicholas E.

AU - Anderson, Ian

AU - Hoover, Richard B.

AU - Walker, Arthur B.Jr.

AU - Hoover, Richard B.

AU - Walker, Arthur B.Jr.

PY - 1996

Y1 - 1996

N2 - W/Si and Co/C multilayers have been deposited on epoxy- replicated Au mirrors from the ASTRO-E telescope project, SPectrum Roentgen Gamma (SRG) flight mirrors, DURAN glass substrates and Si witness wafers. A characterization of the multilayers with both hard x-rays and soft x-rays is presented. The roughness value obtained from the Si wafers and the DURAN glass are in the range 3.0-4.2 angstrom and 4.4-4.6 angstrom, respectively. For the epoxy-replicated Au mirrors roughnesses of 5.0-5.8 angstrom are achieved, while the roughness of the SRG flight mirrors are in the range of 8.5-11.0 angstrom. This clearly indicates the effectiveness of the epoxy-replication process for the production of smooth substrates for multilayer deposition to be used in future x-ray telescopes.

AB - W/Si and Co/C multilayers have been deposited on epoxy- replicated Au mirrors from the ASTRO-E telescope project, SPectrum Roentgen Gamma (SRG) flight mirrors, DURAN glass substrates and Si witness wafers. A characterization of the multilayers with both hard x-rays and soft x-rays is presented. The roughness value obtained from the Si wafers and the DURAN glass are in the range 3.0-4.2 angstrom and 4.4-4.6 angstrom, respectively. For the epoxy-replicated Au mirrors roughnesses of 5.0-5.8 angstrom are achieved, while the roughness of the SRG flight mirrors are in the range of 8.5-11.0 angstrom. This clearly indicates the effectiveness of the epoxy-replication process for the production of smooth substrates for multilayer deposition to be used in future x-ray telescopes.

KW - Characterization

KW - Metal foil

KW - Multilayers

KW - Optical glass

KW - Silicon wafers

KW - Space research

KW - Telescopes

KW - X rays

KW - Mirrors

KW - X

U2 - 10.1117/12.245113

DO - 10.1117/12.245113

M3 - Conference article

VL - 2805

SP - 336

EP - 342

JO - Proceedings of SPIE, the International Society for Optical Engineering

JF - Proceedings of SPIE, the International Society for Optical Engineering

SN - 0277-786X

T2 - Multilayer and Grazing Incidence X-Ray/EUV Optics III

Y2 - 4 August 1996 through 4 August 1996

ER -