W/Si and Co/C multilayers have been deposited on epoxy- replicated Au mirrors from the ASTRO-E telescope project, SPectrum Roentgen Gamma (SRG) flight mirrors, DURAN glass substrates and Si witness wafers. A characterization of the multilayers with both hard x-rays and soft x-rays is presented. The roughness value obtained from the Si wafers and the DURAN glass are in the range 3.0-4.2 angstrom and 4.4-4.6 angstrom, respectively. For the epoxy-replicated Au mirrors roughnesses of 5.0-5.8 angstrom are achieved, while the roughness of the SRG flight mirrors are in the range of 8.5-11.0 angstrom. This clearly indicates the effectiveness of the epoxy-replication process for the production of smooth substrates for multilayer deposition to be used in future x-ray telescopes.
|Conference||Multilayer and Grazing Incidence X-Ray/EUV Optics III|
|Period||04/08/1996 → 04/08/1996|
- Metal foil
- Optical glass
- Silicon wafers
- Space research
- X rays
Hussain, A. M., Joensen, K. D., Hoeghoej, P., Christensen, F. E.
, Louis, E., Voorma, H-J., Soong, Y., White, N. E., Anderson, I., Hoover, R. B., Walker, A. B. J., Hoover, R. B., & Walker, A. B. J. (1996). Deposition and characterization of multilayers on thin foil x-ray mirrors for high-throughput x-ray telescopes
. Proceedings of S P I E - International Society for Optical Engineering
, 336-342. https://doi.org/10.1117/12.245113