Deposition and characterization of multilayers on thin foil x-ray mirrors for high-throughput x-ray telescopes

Ahsen M. Hussain, Karsten D. Joensen, P. Hoeghoej, Finn Erland Christensen, Eric Louis, Harm-Jan Voorma, Yang Soong, Nicholas E. White, Ian Anderson, Richard B. Hoover, Arthur B.Jr. Walker, Richard B. Hoover, Arthur B.Jr. Walker

Research output: Contribution to journalConference articleResearchpeer-review

Abstract

W/Si and Co/C multilayers have been deposited on epoxy- replicated Au mirrors from the ASTRO-E telescope project, SPectrum Roentgen Gamma (SRG) flight mirrors, DURAN glass substrates and Si witness wafers. A characterization of the multilayers with both hard x-rays and soft x-rays is presented. The roughness value obtained from the Si wafers and the DURAN glass are in the range 3.0-4.2 angstrom and 4.4-4.6 angstrom, respectively. For the epoxy-replicated Au mirrors roughnesses of 5.0-5.8 angstrom are achieved, while the roughness of the SRG flight mirrors are in the range of 8.5-11.0 angstrom. This clearly indicates the effectiveness of the epoxy-replication process for the production of smooth substrates for multilayer deposition to be used in future x-ray telescopes.
Original languageEnglish
JournalProceedings of S P I E - International Society for Optical Engineering
Volume2805
Pages (from-to)336-342
ISSN0277-786X
DOIs
Publication statusPublished - 1996
EventMultilayer and Grazing Incidence X-Ray/EUV Optics III - Denver, CO., United States
Duration: 4 Aug 19964 Aug 1996

Conference

ConferenceMultilayer and Grazing Incidence X-Ray/EUV Optics III
CountryUnited States
CityDenver, CO.
Period04/08/199604/08/1996

Keywords

  • Characterization
  • Metal foil
  • Multilayers
  • Optical glass
  • Silicon wafers
  • Space research
  • Telescopes
  • X rays
  • Mirrors
  • X

Cite this

Hussain, A. M., Joensen, K. D., Hoeghoej, P., Christensen, F. E., Louis, E., Voorma, H-J., Soong, Y., White, N. E., Anderson, I., Hoover, R. B., Walker, A. B. J., Hoover, R. B., & Walker, A. B. J. (1996). Deposition and characterization of multilayers on thin foil x-ray mirrors for high-throughput x-ray telescopes. Proceedings of S P I E - International Society for Optical Engineering, 2805, 336-342. https://doi.org/10.1117/12.245113