Dependence of fluxon dynamics on loaded terminations in long overlap Josephson junctions

O.H. Olsen, Mogens Rugholm Samuelsen

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Abstract

Fluxon motion in long overlap-geometry Josephson junctions influenced by loaded terminations is investigated. The combination of results from a perturbation method with an approximate expression for the emitted power yields equations describing the fluxon dynamics. The form of the first zero field step is presented for various parameters and the emitted power is calculated. Journal of Applied Physics is copyrighted by The American Institute of Physics.
Original languageEnglish
JournalJournal of Applied Physics
Volume54
Issue number5
Pages (from-to)2777-2780
ISSN0021-8979
DOIs
Publication statusPublished - 1983

Bibliographical note

Copyright (1983) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

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