TY - JOUR
T1 - Dependence of electric field on STM tip preparation.
AU - Huang, D.H.
AU - Grey, Francois
AU - Aono, M.
PY - 1998
Y1 - 1998
N2 - Voltage pulses applied between an STM tip and a surface can modify the surface on the nanometer scale due to electric-field-induced evaporation. However, at present, different groups have achieved surface modification with quite different bias conditions, and it is still difficult to obtain high reproducibility in such experiments. In this paper, we measure the tip displacement during a pulse at constant tunnelling current, and deduce that the electric field produced by the pulse depends in a systematic way on tip preparation, The results show how differences in tip preparation can be a major source of irreproducibility for STM nanofabrication and atom manipulation. (C) 1998 Elsevier Science B.V. All rights reserved.
AB - Voltage pulses applied between an STM tip and a surface can modify the surface on the nanometer scale due to electric-field-induced evaporation. However, at present, different groups have achieved surface modification with quite different bias conditions, and it is still difficult to obtain high reproducibility in such experiments. In this paper, we measure the tip displacement during a pulse at constant tunnelling current, and deduce that the electric field produced by the pulse depends in a systematic way on tip preparation, The results show how differences in tip preparation can be a major source of irreproducibility for STM nanofabrication and atom manipulation. (C) 1998 Elsevier Science B.V. All rights reserved.
U2 - 10.1016/S0169-4332(98)00175-5
DO - 10.1016/S0169-4332(98)00175-5
M3 - Journal article
SN - 0169-4332
VL - 130-132
SP - 909
EP - 913
JO - Applied Surface Science
JF - Applied Surface Science
ER -