Density of phase singularities in analytic signal of speckle pattern with application to micro-displacement measurement

W. Wang, N. Ishii, Steen Grüner Hanson, Y. Miyamoto, M. Takeda

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearch

    Original languageEnglish
    Title of host publicationTechnical digest
    Place of PublicationTokyo
    PublisherOptical Society of Japan
    Publication date2004
    Pages407-408
    Publication statusPublished - 2004
    Event2004 ICO International Conference on Optics and Photonics in Technology Frontier - Tokyo, Japan
    Duration: 11 Jul 200415 Jul 2004

    Conference

    Conference2004 ICO International Conference on Optics and Photonics in Technology Frontier
    CountryJapan
    CityTokyo
    Period11/07/200415/07/2004

    Cite this

    Wang, W., Ishii, N., Hanson, S. G., Miyamoto, Y., & Takeda, M. (2004). Density of phase singularities in analytic signal of speckle pattern with application to micro-displacement measurement. In Technical digest (pp. 407-408). Optical Society of Japan.