Degradation Processes in High-Power Diode Lasers under External Optical Feedback

Jens. W. Tomm (Invited author), Martin Hempel (Invited author), Paul Michael Petersen (Invited author), Mingjun Chi (Invited author), Ute Zeimer (Invited author), Markus Weyers (Invited author)

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Abstract

The effect of moderate external feedback on the gradual degradation of 808 nm emitting AlGaAs-based high-power broad-area diode lasers is analyzed. Eventually the quantum well that actually experiences the highest total optical load remains unaffected by the aging, while severe impact to the waveguide by point defects is observed.
Original languageEnglish
Title of host publication2013 High Power Diode Lasers and Systems Conference (HPD)
PublisherIEEE
Publication date2013
Pages42-43
ISBN (Print)978-1-4799-2747-0
DOIs
Publication statusPublished - 2013
EventHigh Power Diode Lasers & Systems (HPD 2013) - West Midlands, United Kingdom
Duration: 16 Oct 201317 Oct 2013
http://www.photonex.org/conference/13/high-power-diode-lasers-&-systems.html

Conference

ConferenceHigh Power Diode Lasers & Systems (HPD 2013)
CountryUnited Kingdom
CityWest Midlands
Period16/10/201317/10/2013
Internet address

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