Abstract
The changes in the DC-field in solid dielectric cables under transient thermal conditions were analyzed. The temperature gradient generated by load current under normal operating conditions changed the electric field distribution in a resistively graded dielectric. It was observed that the time constant could be determined by field- and temperature-dependent carrier mobility. With the same time constant for temperatures at the inner and outer semiconductor it was possible to maintain the stability of the electric field even though temperature changed.
| Original language | English |
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| Title of host publication | IEEE International Conference on Conduction and Breakdown in Solid Dielectrics |
| Publication date | 2001 |
| Pages | 58-61 |
| Publication status | Published - 2001 |
| Event | 2001 IEEE 7th International Conference on Solid Dielectrics - Dorint Hotel, Eindhoven, Netherlands Duration: 25 Jun 2001 → 29 Jun 2001 Conference number: 7 |
Conference
| Conference | 2001 IEEE 7th International Conference on Solid Dielectrics |
|---|---|
| Number | 7 |
| Location | Dorint Hotel |
| Country/Territory | Netherlands |
| City | Eindhoven |
| Period | 25/06/2001 → 29/06/2001 |