TY - GEN
T1 - Data-driven modeling of nano-nose gas sensor arrays
AU - Alstrøm, Tommy Sonne
AU - Larsen, Jan
AU - Nielsen, Claus Højgård
AU - Larsen, Niels Bent
PY - 2010
Y1 - 2010
N2 - We present a data-driven approach to classification of Quartz Crystal Microbalance (QCM) sensor data. The sensor is a nano-nose gas sensor that detects concentrations of analytes down to ppm levels using plasma polymorized coatings. Each sensor experiment takes approximately one hour hence the number of available training data is limited. We suggest a data-driven classification model which work from few examples. The paper compares a number of data-driven classification and quantification schemes able to detect the gas and the concentration level. The data-driven approaches are based on state-of-the-art machine learning methods and the Bayesian learning paradigm.
AB - We present a data-driven approach to classification of Quartz Crystal Microbalance (QCM) sensor data. The sensor is a nano-nose gas sensor that detects concentrations of analytes down to ppm levels using plasma polymorized coatings. Each sensor experiment takes approximately one hour hence the number of available training data is limited. We suggest a data-driven classification model which work from few examples. The paper compares a number of data-driven classification and quantification schemes able to detect the gas and the concentration level. The data-driven approaches are based on state-of-the-art machine learning methods and the Bayesian learning paradigm.
KW - Concentration Level Estimation
KW - Gaussian Process Regression (GPR)
KW - Classification
KW - Principal Component Analysis (PCA)
KW - Polymer Coated Quartz Crystal Microbalance Sensor (QCM)
KW - Non-negative Matrix Factorization (NMF)
KW - Principal Component Regression (PCR)
KW - Artificial Neural Network (ANN)
M3 - Article in proceedings
VL - 7697
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Signal Processing, Sensor Fusion, and Target Recognition Xix
PB - SPIE - International Society for Optical Engineering
CY - Bellingham
T2 - SPIE Defense, Security and Sensing 2010
Y2 - 5 April 2010 through 9 April 2010
ER -