Dark-field X-ray microscopy reveals mosaicity and strain gradients across sub-surface TiC and TiN particles in steel matrix composites

K. Hlushko, J. Keckes*, G. Ressel, J. Pörnbacher, W. Ecker, Mustafacan Kutsal, P. K. Cook, C. Detlefs, C. Yildirim

*Corresponding author for this work

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

Residual strain gradients and crystallographic mosaicity across embedded ceramic particles within metal-matrix composites have remained experimentally inaccessible. In this work, we use synchrotron dark-field X-ray microscopy to characterize strain and orientation gradients across ~20 µm large TiC and TiN particles embedded in a steel matrix annealed at 480 and 600 °C. The results document gradual crystallographic orientation changes across the particles and the presence of sub-grains, in contrast to electron backscatter diffraction data. These gradients appear, however, not directly correlated with the observed strain gradients, which are attributed mainly to the different strain states within particles’ interiors and envelopes.
Original languageEnglish
JournalScripta Materialia
Volume187
Pages (from-to)402-406
ISSN1359-6462
DOIs
Publication statusPublished - 2020

Keywords

  • Metal matric composites
  • Residual strain
  • Crystal orientation
  • TiN and TiC
  • Dark-field X-ray microscopy

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