Dark field X-ray microscopy for studies of recrystallization

Sonja Rosenlund Ahl, Hugh Simons, Anders Clemen Jakobsen, Yubin Zhang, Frederik Stöhr, Dorte Juul Jensen, Henning Friis Poulsen

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Abstract

We present the recently developed technique of Dark Field X-Ray Microscopy that utilizes the diffraction of hard X-rays from individual grains or subgrains at the (sub)micrometre- scale embedded within mm-sized samples. By magnifying the diffracted signal, 3D mapping of orientations and strains inside the selected grain is performed with an angular resolution of 0:005o and a spatial resolution of 200 nm. Furthermore, the speed of the measurements at high- intensity synchrotron facilities allows for fast non-destructive in situ determination of structural changes induced by annealing or other external influences. The capabilities of Dark Field X- Ray Microscopy are illustrated by examples from an ongoing study of recrystallization of 50% cold-rolled Al1050 specimens.
Original languageEnglish
Article number012016
JournalI O P Conference Series: Materials Science and Engineering
Volume89
Number of pages7
ISSN1757-8981
DOIs
Publication statusPublished - 2015
Event36th Risø International Symposium on Materials Science - DTU Risø Campus, Roskilde, Denmark
Duration: 7 Sep 201511 Sep 2015
Conference number: 36

Conference

Conference36th Risø International Symposium on Materials Science
Number36
LocationDTU Risø Campus
Country/TerritoryDenmark
CityRoskilde
Period07/09/201511/09/2015

Bibliographical note

Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI. Published under licence by IOP Publishing Ltd

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