Dark field X-ray microscopy for studies of recrystallization

Sonja Rosenlund Ahl, Hugh Simons, Anders Clemen Jakobsen, Yubin Zhang, Frederik Stöhr, Dorte Juul Jensen, Henning Friis Poulsen

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We present the recently developed technique of Dark Field X-Ray Microscopy that utilizes the diffraction of hard X-rays from individual grains or subgrains at the (sub)micrometre- scale embedded within mm-sized samples. By magnifying the diffracted signal, 3D mapping of orientations and strains inside the selected grain is performed with an angular resolution of 0:005o and a spatial resolution of 200 nm. Furthermore, the speed of the measurements at high- intensity synchrotron facilities allows for fast non-destructive in situ determination of structural changes induced by annealing or other external influences. The capabilities of Dark Field X- Ray Microscopy are illustrated by examples from an ongoing study of recrystallization of 50% cold-rolled Al1050 specimens.
Original languageEnglish
Article number012016
JournalI O P Conference Series: Materials Science and Engineering
Number of pages7
Publication statusPublished - 2015
Event36th Risø International Symposium on Materials Science - DTU Risø Campus, Roskilde, Denmark
Duration: 7 Sep 201511 Sep 2015
Conference number: 36


Conference36th Risø International Symposium on Materials Science
LocationDTU Risø Campus

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