Dark-field X-ray microscopy for multiscale structural characterization

Hugh Simons, A. King, W. Ludwig, C. Detlefs, Wolfgang Pantleon, Søren Schmidt, I. Snigireva, Frederik Stöhr, A. Snigirev, Henning Friis Poulsen

Research output: Contribution to journalJournal articleResearchpeer-review

486 Downloads (Pure)

Abstract

Many physical and mechanical properties of crystalline materials depend strongly on their internal structure, which is typically organized into grains and domains on several length scales. Here we present dark-field X-ray microscopy; a non-destructive microscopy technique for the three-dimensional mapping of orientations and stresses on lengths scales from 100 nm to 1mm within embedded sampling volumes. The technique, which allows 'zooming' in and out in both direct and angular space, is demonstrated by an annealing study of plastically deformed aluminium. Facilitating the direct study of the interactions between crystalline elements is a key step towards the formulation and validation of multiscale models that account for the entire heterogeneity of a material. Furthermore, dark-field X-ray microscopy is well suited to applied topics, where the structural evolution of internal nanoscale elements (for example, positioned at interfaces) is crucial to the performance and lifetime of macro-scale devices and components thereof.
Original languageEnglish
Article number6098
JournalNature Communications
Volume6
Number of pages6
ISSN2041-1723
DOIs
Publication statusPublished - 2015

Bibliographical note

This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material.

Keywords

  • MULTIDISCIPLINARY
  • PLASTIC-DEFORMATION
  • ELECTRON-MICROSCOPE
  • REFRACTIVE LENSES
  • INDIVIDUAL GRAINS
  • DIFFRACTION
  • TOMOGRAPHY
  • RECRYSTALLIZATION
  • DISLOCATION
  • CRYSTALS
  • METALS

Fingerprint Dive into the research topics of 'Dark-field X-ray microscopy for multiscale structural characterization'. Together they form a unique fingerprint.

Cite this