Dark-field x-ray microscopy for 2D and 3D imaging of microstructural dynamics at the European x-ray free-electron laser

Sara J. Irvine; Kento Katagiri; Trygve M. Ræder; Ulrike Boesenberg; Darshan Chalise; Jade I. Stanton; Dayeeta Pal; Jörg Hallmann; Gabriele Ansaldi; Felix Brauße; Jon H. Eggert; Lichao Fang; Eric Folsom; Morten Haubro; Theodor S. Holstad; Anders Madsen; Johannes Möller; Martin M. Nielsen; Henning F. Poulsen; Jan Etienne Pudell; Angel Rodriguez-Fernandez; Frank Schoofs; Frank Seiboth; Yifan Wang; Wonhyuk Jo; Mohamed Youssef; Alexey Zozulya; Kristoffer Haldrup; Leora E. Dresselhaus-Marais

doi:10.1063/5.0239034

Dark-field x-ray microscopy for 2D and 3D imaging of microstructural dynamics at the European x-ray free-electron laser

Sara J. Irvine
, Kento Katagiri
, Trygve M. Ræder
, Ulrike Boesenberg
, Darshan Chalise
, Jade I. Stanton
, Dayeeta Pal
, Jörg Hallmann
, Gabriele Ansaldi
, Felix Brauße
, Jon H. Eggert
, Lichao Fang
, Eric Folsom
, Morten Haubro
, Theodor S. Holstad
, Anders Madsen
, Johannes Möller
, Martin M. Nielsen
, Henning F. Poulsen
, Jan Etienne Pudell

Angel Rodriguez-Fernandez, Frank Schoofs, Frank Seiboth, Yifan Wang, Wonhyuk Jo, Mohamed Youssef, Alexey Zozulya, Kristoffer Haldrup, Leora E. Dresselhaus-Marais^*

^*Corresponding author for this work

Stanford University
Stanford Linear Accelerator Center
European XFEL
Lawrence Livermore National Laboratory
FS Consulting
German Electron Synchrotron

Research output: Contribution to journal › Journal article › Research › peer-review

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Abstract

Dark field x-ray microscopy (DXFM) can visualize microstructural distortions in bulk crystals. Using the femtosecond x-ray pulses generated by x-ray free-electron lasers (XFELs), DFXM can achieve sub-μm spatial resolution and <100 fs time resolution simultaneously. In this paper, we demonstrate ultrafast DFXM measurements at the European XFEL to visualize an optically driven longitudinal strain wave propagating through a diamond single crystal. We also present two DFXM scanning modalities that are new to the XFEL sources: spatial 3D and 2D axial-strain scans with sub-μm spatial resolution. With this progress in XFEL-based DFXM, we discuss new opportunities to study multi-timescale spatiotemporal dynamics of microstructures.

Original language	English
Article number	053106
Journal	Journal of Applied Physics
Volume	137
Issue number	5
Number of pages	10
ISSN	0021-8979
DOIs	https://doi.org/10.1063/5.0239034
Publication status	Published - 2025

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Irvine, S. J., Katagiri, K., Ræder, T. M., Boesenberg, U., Chalise, D., Stanton, J. I., Pal, D., Hallmann, J., Ansaldi, G., Brauße, F., Eggert, J. H., Fang, L., Folsom, E., Haubro, M., Holstad, T. S., Madsen, A., Möller, J., Nielsen, M. M., Poulsen, H. F., ... Dresselhaus-Marais, L. E. (2025). Dark-field x-ray microscopy for 2D and 3D imaging of microstructural dynamics at the European x-ray free-electron laser. Journal of Applied Physics, 137(5), Article 053106. https://doi.org/10.1063/5.0239034

@article{db7fc8a2ba844904bba6729900703908,

title = "Dark-field x-ray microscopy for 2D and 3D imaging of microstructural dynamics at the European x-ray free-electron laser",

abstract = "Dark field x-ray microscopy (DXFM) can visualize microstructural distortions in bulk crystals. Using the femtosecond x-ray pulses generated by x-ray free-electron lasers (XFELs), DFXM can achieve sub-μm spatial resolution and <100 fs time resolution simultaneously. In this paper, we demonstrate ultrafast DFXM measurements at the European XFEL to visualize an optically driven longitudinal strain wave propagating through a diamond single crystal. We also present two DFXM scanning modalities that are new to the XFEL sources: spatial 3D and 2D axial-strain scans with sub-μm spatial resolution. With this progress in XFEL-based DFXM, we discuss new opportunities to study multi-timescale spatiotemporal dynamics of microstructures.",

author = "Irvine, \{Sara J.\} and Kento Katagiri and R{\ae}der, \{Trygve M.\} and Ulrike Boesenberg and Darshan Chalise and Stanton, \{Jade I.\} and Dayeeta Pal and J{\"o}rg Hallmann and Gabriele Ansaldi and Felix Brau{\ss}e and Eggert, \{Jon H.\} and Lichao Fang and Eric Folsom and Morten Haubro and Holstad, \{Theodor S.\} and Anders Madsen and Johannes M{\"o}ller and Nielsen, \{Martin M.\} and Poulsen, \{Henning F.\} and Pudell, \{Jan Etienne\} and Angel Rodriguez-Fernandez and Frank Schoofs and Frank Seiboth and Yifan Wang and Wonhyuk Jo and Mohamed Youssef and Alexey Zozulya and Kristoffer Haldrup and Dresselhaus-Marais, \{Leora E.\}",

note = "Publisher Copyright: {\textcopyright} 2025 Author(s).",

year = "2025",

doi = "10.1063/5.0239034",

language = "English",

volume = "137",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

number = "5",

}

Irvine, SJ, Katagiri, K, Ræder, TM, Boesenberg, U, Chalise, D, Stanton, JI, Pal, D, Hallmann, J, Ansaldi, G, Brauße, F, Eggert, JH, Fang, L, Folsom, E, Haubro, M, Holstad, TS, Madsen, A, Möller, J, Nielsen, MM , Poulsen, HF, Pudell, JE, Rodriguez-Fernandez, A, Schoofs, F, Seiboth, F, Wang, Y, Jo, W, Youssef, M, Zozulya, A, Haldrup, K & Dresselhaus-Marais, LE 2025, 'Dark-field x-ray microscopy for 2D and 3D imaging of microstructural dynamics at the European x-ray free-electron laser', Journal of Applied Physics, vol. 137, no. 5, 053106. https://doi.org/10.1063/5.0239034

TY - JOUR

T1 - Dark-field x-ray microscopy for 2D and 3D imaging of microstructural dynamics at the European x-ray free-electron laser

AU - Irvine, Sara J.

AU - Katagiri, Kento

AU - Ræder, Trygve M.

AU - Boesenberg, Ulrike

AU - Chalise, Darshan

AU - Stanton, Jade I.

AU - Pal, Dayeeta

AU - Hallmann, Jörg

AU - Ansaldi, Gabriele

AU - Brauße, Felix

AU - Eggert, Jon H.

AU - Fang, Lichao

AU - Folsom, Eric

AU - Haubro, Morten

AU - Holstad, Theodor S.

AU - Madsen, Anders

AU - Möller, Johannes

AU - Nielsen, Martin M.

AU - Poulsen, Henning F.

AU - Pudell, Jan Etienne

AU - Rodriguez-Fernandez, Angel

AU - Schoofs, Frank

AU - Seiboth, Frank

AU - Wang, Yifan

AU - Jo, Wonhyuk

AU - Youssef, Mohamed

AU - Zozulya, Alexey

AU - Haldrup, Kristoffer

AU - Dresselhaus-Marais, Leora E.

PY - 2025

Y1 - 2025

N2 - Dark field x-ray microscopy (DXFM) can visualize microstructural distortions in bulk crystals. Using the femtosecond x-ray pulses generated by x-ray free-electron lasers (XFELs), DFXM can achieve sub-μm spatial resolution and <100 fs time resolution simultaneously. In this paper, we demonstrate ultrafast DFXM measurements at the European XFEL to visualize an optically driven longitudinal strain wave propagating through a diamond single crystal. We also present two DFXM scanning modalities that are new to the XFEL sources: spatial 3D and 2D axial-strain scans with sub-μm spatial resolution. With this progress in XFEL-based DFXM, we discuss new opportunities to study multi-timescale spatiotemporal dynamics of microstructures.

AB - Dark field x-ray microscopy (DXFM) can visualize microstructural distortions in bulk crystals. Using the femtosecond x-ray pulses generated by x-ray free-electron lasers (XFELs), DFXM can achieve sub-μm spatial resolution and <100 fs time resolution simultaneously. In this paper, we demonstrate ultrafast DFXM measurements at the European XFEL to visualize an optically driven longitudinal strain wave propagating through a diamond single crystal. We also present two DFXM scanning modalities that are new to the XFEL sources: spatial 3D and 2D axial-strain scans with sub-μm spatial resolution. With this progress in XFEL-based DFXM, we discuss new opportunities to study multi-timescale spatiotemporal dynamics of microstructures.

U2 - 10.1063/5.0239034

DO - 10.1063/5.0239034

M3 - Journal article

AN - SCOPUS:85217443447

SN - 0021-8979

VL - 137

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 5

M1 - 053106

ER -

Dark-field x-ray microscopy for 2D and 3D imaging of microstructural dynamics at the European x-ray free-electron laser

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