Cs corrected bright field TEM imaging of radiation sensitive materials

M. Malac, Marco Beleggia, R. F. Egerton, Y. Zhu

Research output: Contribution to journalConference articleResearchpeer-review

Original languageEnglish
JournalMicroscopy and Microanalysis
Volume11
Issue numberSupplement S02
Pages (from-to)2150-2151
Number of pages2
ISSN1431-9276
DOIs
Publication statusPublished - 2005
Externally publishedYes
EventMicroscopy and Microanalysis 2005 - Honolulu, HI, United States
Duration: 31 Jul 20054 Aug 2005

Conference

ConferenceMicroscopy and Microanalysis 2005
Country/TerritoryUnited States
CityHonolulu, HI
Period31/07/200504/08/2005

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