Abstract
Crystalline-to-rotator phase transitions have been widely studied in bulk hydrocarbons, in particular in normal alkanes. But few studies of these transitions deal with molecularly thin films of pure n-alkanes on solid substrates. In this work, we were able to grow dotriacontane (n-C32H66) films without coexisting bulk particles, which allows us to isolate the contribution to the ellipsometric signal from a monolayer of molecules oriented with their long axis perpendicular to the SiO2 surface. For these submonolayer films, we found a step in the ellipsometer signal at similar to 331 K, which we identify with a solid-solid phase transition. At higher coverages, we observed additional steps in the ellipsometric signal that we identify with a solid-solid phase transition in multilayer islands (similar to 333 K) and with the transition to the rotator phase in bulk crystallites (similar to 337 K), respectively. After considering three alternative explanations, we propose that the step upward in the ellipsometric signal observed at similar to 331 K on heating the submonolayer film is the signature of a transition from a perpendicular monolayer phase to a denser phase in which the alkane chains contain on average one to two gauche defects per molecule. (C) 2009 American Institute of Physics. [doi: 10.1063/1.3213642]
Original language | English |
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Journal | Journal of Chemical Physics |
Volume | 131 |
Issue number | 11 |
Pages (from-to) | 114705 |
ISSN | 0021-9606 |
DOIs | |
Publication status | Published - 2009 |
Bibliographical note
Copyright (2009) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.Keywords
- COVERAGE
- X-RAY-SCATTERING
- HIGH-RESOLUTION
- SIO2/AIR INTERFACES
- THICKNESS
- NORMAL-ALKANES
- MONOLAYERS
- TRIACONTANE
- GRAPHITE
- GROWTH MODE