Critical factors in SEM 3D reconstruction

Francesco Marinello, Paolo Bariani, E. Savio, Andy Horsewell, Leonardo De Chiffre

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

    Original languageEnglish
    Title of host publicationProc. Int. euspen Conf.
    Publication date2007
    Publication statusPublished - 2007
    Event7th International Conference of the European Society for Precision Engineering and Nanotechnology - Bremen, Germany
    Duration: 20 May 200724 May 2007
    Conference number: 7

    Conference

    Conference7th International Conference of the European Society for Precision Engineering and Nanotechnology
    Number7
    CountryGermany
    CityBremen
    Period20/05/200724/05/2007

    Cite this

    Marinello, F., Bariani, P., Savio, E., Horsewell, A., & De Chiffre, L. (2007). Critical factors in SEM 3D reconstruction. In Proc. Int. euspen Conf.