Critical current density measurement of thin films by AC susceptibility based on the penetration parameter h

Xiao-Fen Li, Jean-Claude Grivel, Asger B. Abrahamsen, Niels Hessel Andersen

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

We have numerically proved that the dependence of AC susceptibility χ of a E(J) power law superconducting thin disc on many parameters can be reduced to one penetration parameter h, with E the electric field and J the current density. Based on this result, we propose a way of measuring the critical current density Jc of superconducting thin films by AC susceptibility. Compared with the normally used method based on the peak of the imaginary part, our method uses a much larger range of the AC susceptibility curve, thus allowing determination of the temperature (T) dependence of Jc from a normally applied χ(T) measurement. A fitting equation Jc=1.9Ha∣χ′∣0.69/d, −0.4
Original languageEnglish
JournalPhysica C: Superconductivity and its Applications
Volume477
Pages (from-to)6-14
ISSN0921-4534
DOIs
Publication statusPublished - 2012

Keywords

  • Critical current density
  • AC susceptibility
  • Superconducting thin film
  • London penetration depth

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