Correlating Oxygen Electrode Degradation to Cr Vaporization from Metallic Interconnects in Solid Oxide Cell Stacks

Belma Talic, Peter Vang Hendriksen

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Correlating Oxygen Electrode Degradation to Cr Vaporization from Metallic Interconnects in Solid Oxide Cell Stacks
Belma Talic (Speaker) & Peter Vang Hendriksen (Other)
25 Jan 2018
Activity: Talks and presentations › Conference presentations

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