Correction to: Accuracy of surface strain measurements from transmission electron microscopy images of nanoparticles

Jacob Madsen; Pei Liu; Jakob Birkedal Wagner; Thomas W. Hansen; Jakob Schiøtz

doi:10.1186/s40679-017-0049-y

Correction to: Accuracy of surface strain measurements from transmission electron microscopy images of nanoparticles

Jacob Madsen, Pei Liu, Jakob Birkedal Wagner, Thomas W. Hansen, Jakob Schiøtz

Research output: Contribution to journal › Comment/debate › Research › peer-review

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Abstract

Unfortunately, after publication of this article [1], it was noticed that the name of the fifth author was incorrectly displayed as Jakob Schiøz. The correct name is Jakob Schiøtz and can be seen in the corrected author list above. The original article has also been updated to correct this error.

Original language	English
Journal	Advanced Structural and Chemical Imaging
Volume	3
Issue number	1
Pages (from-to)	1-12
Number of pages	12
ISSN	2198-0926
DOIs	https://doi.org/10.1186/s40679-017-0049-y
Publication status	Published - 2017

Bibliographical note

This article is distributed under the terms of the Creative Commons Attribution 4.0 International License

Keywords

High-resolution transmission electron microscopy
Strain mapping
Nanoparticles
Surface strain

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10.1186/s40679-017-0049-y

S40679 017 0049 yFinal published version, 672 KB

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title = "Correction to: Accuracy of surface strain measurements from transmission electron microscopy images of nanoparticles",

abstract = "Unfortunately, after publication of this article [1], it was noticed that the name of the fifth author was incorrectly displayed as Jakob Schi{\o}z. The correct name is Jakob Schi{\o}tz and can be seen in the corrected author list above. The original article has also been updated to correct this error.",

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AU - Madsen, Jacob

AU - Liu, Pei

AU - Wagner, Jakob Birkedal

AU - Hansen, Thomas W.

AU - Schiøtz, Jakob

N1 - This article is distributed under the terms of the Creative Commons Attribution 4.0 International License

PY - 2017

Y1 - 2017

N2 - Unfortunately, after publication of this article [1], it was noticed that the name of the fifth author was incorrectly displayed as Jakob Schiøz. The correct name is Jakob Schiøtz and can be seen in the corrected author list above. The original article has also been updated to correct this error.

AB - Unfortunately, after publication of this article [1], it was noticed that the name of the fifth author was incorrectly displayed as Jakob Schiøz. The correct name is Jakob Schiøtz and can be seen in the corrected author list above. The original article has also been updated to correct this error.

KW - High-resolution transmission electron microscopy

KW - Strain mapping

KW - Nanoparticles

KW - Surface strain

U2 - 10.1186/s40679-017-0049-y

DO - 10.1186/s40679-017-0049-y

M3 - Comment/debate

SN - 2198-0926

VL - 3

SP - 1

EP - 12

JO - Advanced Structural and Chemical Imaging

JF - Advanced Structural and Chemical Imaging

IS - 1

ER -

Correction to: Accuracy of surface strain measurements from transmission electron microscopy images of nanoparticles

Abstract

Bibliographical note

Keywords

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