Controlled atmosphere high-temperature scanning probe microscopy (CAHT-SPM)

Research output: Chapter in Book/Report/Conference proceedingBook chapterResearchpeer-review

Original languageEnglish
Title of host publicationMetal Oxide-Based Thin Film Structures : Formation, Characterization and Application of Interface-Based Phenomena
PublisherElsevier
Publication date2017
Pages203-223
Chapter9
ISBN (Print)978-0-12-811166-6
DOIs
Publication statusPublished - 2017

Cite this

Hansen, K. V. (2017). Controlled atmosphere high-temperature scanning probe microscopy (CAHT-SPM). In Metal Oxide-Based Thin Film Structures: Formation, Characterization and Application of Interface-Based Phenomena (pp. 203-223). Elsevier. https://doi.org/10.1016/B978-0-12-811166-6.00009-1
Hansen, Karin Vels. / Controlled atmosphere high-temperature scanning probe microscopy (CAHT-SPM). Metal Oxide-Based Thin Film Structures: Formation, Characterization and Application of Interface-Based Phenomena. Elsevier, 2017. pp. 203-223
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Hansen, KV 2017, Controlled atmosphere high-temperature scanning probe microscopy (CAHT-SPM). in Metal Oxide-Based Thin Film Structures: Formation, Characterization and Application of Interface-Based Phenomena. Elsevier, pp. 203-223. https://doi.org/10.1016/B978-0-12-811166-6.00009-1

Controlled atmosphere high-temperature scanning probe microscopy (CAHT-SPM). / Hansen, Karin Vels.

Metal Oxide-Based Thin Film Structures: Formation, Characterization and Application of Interface-Based Phenomena. Elsevier, 2017. p. 203-223.

Research output: Chapter in Book/Report/Conference proceedingBook chapterResearchpeer-review

TY - CHAP

T1 - Controlled atmosphere high-temperature scanning probe microscopy (CAHT-SPM)

AU - Hansen, Karin Vels

PY - 2017

Y1 - 2017

U2 - 10.1016/B978-0-12-811166-6.00009-1

DO - 10.1016/B978-0-12-811166-6.00009-1

M3 - Book chapter

SN - 978-0-12-811166-6

SP - 203

EP - 223

BT - Metal Oxide-Based Thin Film Structures

PB - Elsevier

ER -

Hansen KV. Controlled atmosphere high-temperature scanning probe microscopy (CAHT-SPM). In Metal Oxide-Based Thin Film Structures: Formation, Characterization and Application of Interface-Based Phenomena. Elsevier. 2017. p. 203-223 https://doi.org/10.1016/B978-0-12-811166-6.00009-1