Abstract
A novel approach to reducing the multiple reflections between the test antenna and the probe in near-field antenna measurements is proposed. Instead of absorbers, this approach makes use of a skirt on the probe to shield against the mounting structure behind the probe.
| Original language | English |
|---|---|
| Journal | Electronics Letters |
| Volume | 40 |
| Issue number | 5 |
| Pages (from-to) | 284-285 |
| ISSN | 0013-5194 |
| DOIs | |
| Publication status | Published - 2004 |
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