Control of scattering from probes for near-field antenna measurements by use of skirt

A. Frandsen, Sergiy Pivnenko, Olav Breinbjerg

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

A novel approach to reducing the multiple reflections between the test antenna and the probe in near-field antenna measurements is proposed. Instead of absorbers, this approach makes use of a skirt on the probe to shield against the mounting structure behind the probe.
Original languageEnglish
JournalElectronics Letters
Volume40
Issue number5
Pages (from-to)284-285
ISSN0013-5194
Publication statusPublished - 2004

Cite this

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title = "Control of scattering from probes for near-field antenna measurements by use of skirt",
abstract = "A novel approach to reducing the multiple reflections between the test antenna and the probe in near-field antenna measurements is proposed. Instead of absorbers, this approach makes use of a skirt on the probe to shield against the mounting structure behind the probe.",
author = "A. Frandsen and Sergiy Pivnenko and Olav Breinbjerg",
year = "2004",
language = "English",
volume = "40",
pages = "284--285",
journal = "Electronics Letters",
issn = "0013-5194",
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number = "5",

}

Control of scattering from probes for near-field antenna measurements by use of skirt. / Frandsen, A.; Pivnenko, Sergiy; Breinbjerg, Olav.

In: Electronics Letters, Vol. 40, No. 5, 2004, p. 284-285.

Research output: Contribution to journalJournal articleResearchpeer-review

TY - JOUR

T1 - Control of scattering from probes for near-field antenna measurements by use of skirt

AU - Frandsen, A.

AU - Pivnenko, Sergiy

AU - Breinbjerg, Olav

PY - 2004

Y1 - 2004

N2 - A novel approach to reducing the multiple reflections between the test antenna and the probe in near-field antenna measurements is proposed. Instead of absorbers, this approach makes use of a skirt on the probe to shield against the mounting structure behind the probe.

AB - A novel approach to reducing the multiple reflections between the test antenna and the probe in near-field antenna measurements is proposed. Instead of absorbers, this approach makes use of a skirt on the probe to shield against the mounting structure behind the probe.

M3 - Journal article

VL - 40

SP - 284

EP - 285

JO - Electronics Letters

JF - Electronics Letters

SN - 0013-5194

IS - 5

ER -