Confocal polarization tomography of dielectric nanocavities

Frederik Schröder, Martin P. Van Exter, Meng Xiong, George Kountouris, Martijn Wubs, Philip T. Kristensen, Nicolas Stenger*

*Corresponding author for this work

Research output: Contribution to journalJournal articleResearchpeer-review

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Abstract

We employ polarization tomography to characterize the modal properties of a dielectric nanocavity with sub-wavelength mode confinement. Our analysis of reflection spectra shows that the Fano-lineshape depends strongly on the polarization in a confocal configuration, and that the lineshape can be transformed into a Lorentzian-like peak for a certain polarization. For this polarization setting, the background is almost fully suppressed in a finite range of frequencies. This enables us to identify another resonance that has not yet been experimentally reported for these nanocavities. Lastly, we use symmetry-forbidden polarizations and show that, surprisingly, the modal resonance features of the system remain visible.

Original languageEnglish
JournalNanophotonics
Number of pages11
ISSN2192-8606
DOIs
Publication statusAccepted/In press - 2025

Bibliographical note

Publisher Copyright:
© 2025 the author(s), published by De Gruyter, Berlin/Boston 2025.

Keywords

  • Confocal microscopy
  • Extreme dielectric confinement;
  • Fano lineshape
  • Polarization tomography

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