Computer simulations analysis for determining the polarity of charge generated by high energy electron irradiation of a thin film

Marek Malac, Simon Hettler, Misa Hayashida, Masahiro Kawasaki, Yuji Konyuba, Yoshi Okura, Hirofumi Iijima, Isamu Ishikawa, Marco Beleggia

    Research output: Contribution to journalJournal articleResearchpeer-review

    Abstract

    Detailed simulations are necessary to correctly interpret the charge polarity of electron beam irradiated thin film patch. Relying on systematic simulations we provide guidelines and movies to interpret experimentally the polarity of the charged area, to be understood as the sign of the electrostatic potential developed under the beam with reference to a ground electrode. We discuss the two methods most frequently used to assess charge polarity: Fresnel imaging of the irradiated area and Thon rings analysis. We also briefly discuss parameter optimization for hole free phase plate (HFPP) imaging. Our results are particularly relevant to understanding contrast of hole-free phase plate imaging and Berriman effect.
    Original languageEnglish
    JournalMicron
    Volume100
    Pages (from-to)10-22
    Number of pages13
    ISSN0968-4328
    DOIs
    Publication statusPublished - 2017

    Keywords

    • Electron beam induced charging
    • Fresnel images
    • Hole-free phase plate
    • Radiation damage
    • Thon rings
    • Volta phase plate

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