Computer simulation of electron nanodiffraction from polycrystalline materials

K. Sugio, Xiaoxu Huang

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

Original language	English
Title of host publication	EMC 2008. Proceedings. Vol. 1: Instrumentation and methods
Editors	M. Luysberg, K. Tillmann, T. Weirich
Publisher	Springer
Publication date	2008
Pages	227-228
ISBN (Print)	978-3-540-85156-1
Publication status	Published - 2008
Event	14th European Microscopy Congress - Eurogress Centre, Aachen, Germany Duration: 1 Sept 2008 → 5 Sept 2008 Conference number: 14 https://www.eurmicsoc.org/en/meeting-calendar/emc-series/

Conference	14th European Microscopy Congress
Number	14
Location	Eurogress Centre
Country/Territory	Germany
City	Aachen
Period	01/09/2008 → 05/09/2008
Internet address	https://www.eurmicsoc.org/en/meeting-calendar/emc-series/

OpenUrl availability

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title = "Computer simulation of electron nanodiffraction from polycrystalline materials",

keywords = "Energiteknologier p{\aa} vej",

author = "K. Sugio and Xiaoxu Huang",

year = "2008",

language = "English",

isbn = "978-3-540-85156-1",

pages = "227--228",

editor = "M. Luysberg and K. Tillmann and T. Weirich",

booktitle = "EMC 2008. Proceedings. Vol. 1: Instrumentation and methods",

publisher = "Springer",

note = "14th European Microscopy Congress, EMC 2008 ; Conference date: 01-09-2008 Through 05-09-2008",

url = "https://www.eurmicsoc.org/en/meeting-calendar/emc-series/",

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TY - GEN

T1 - Computer simulation of electron nanodiffraction from polycrystalline materials

AU - Sugio, K.

AU - Huang, Xiaoxu

N1 - Conference code: 14

PY - 2008

Y1 - 2008

KW - Energiteknologier på vej

M3 - Article in proceedings

SN - 978-3-540-85156-1

SP - 227

EP - 228

BT - EMC 2008. Proceedings. Vol. 1: Instrumentation and methods

A2 - Luysberg, M.

A2 - Tillmann, K.

A2 - Weirich, T.

PB - Springer

T2 - 14th European Microscopy Congress

Y2 - 1 September 2008 through 5 September 2008

ER -