Computer simulation of electron nanodiffraction from polycrystalline materials

K. Sugio, Xiaoxu Huang

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

    Original languageEnglish
    Title of host publicationEMC 2008. Proceedings. Vol. 1: Instrumentation and methods
    EditorsM. Luysberg, K. Tillmann, T. Weirich
    PublisherSpringer
    Publication date2008
    Pages227-228
    ISBN (Print)978-3-540-85156-1
    Publication statusPublished - 2008
    Event14th European Microscopy Congress - Aachen, Germany
    Duration: 1 Sep 20085 Sep 2008
    Conference number: 14
    http://www.eurmicsoc.org/emc2008.html

    Conference

    Conference14th European Microscopy Congress
    Number14
    CountryGermany
    CityAachen
    Period01/09/200805/09/2008
    Internet address

    Cite this

    Sugio, K., & Huang, X. (2008). Computer simulation of electron nanodiffraction from polycrystalline materials. In M. Luysberg, K. Tillmann, & T. Weirich (Eds.), EMC 2008. Proceedings. Vol. 1: Instrumentation and methods (pp. 227-228). Springer.