Computed tomography for dimensional metrology

J.P. Kruth; M. Bartscher; S. Carmignato; R. Schmitt; Leonardo De Chiffre; A. Weckenmann

doi:10.1016/j.cirp.2011.05.006

Computed tomography for dimensional metrology

J.P. Kruth, M. Bartscher, S. Carmignato, R. Schmitt, Leonardo De Chiffre, A. Weckenmann

Research output: Contribution to journal › Journal article › Research › peer-review

Abstract

The paper gives a survey of the upcoming use of X-ray computed tomography (CT) for dimensional quality control purposes: i.e. for traceable measurement of dimensions of technical (mechanical) components and for tolerance verification of such components. It describes the basic principles of CT metrology, putting emphasis on issues as accuracy, traceability to the unit of length (the meter) and measurement uncertainty. It provides a state of the art (anno 2011) and application examples, showing the aptitude of CT metrology to: (i) check internal dimensions that cannot be measured using traditional coordinate measuring machines and (ii) combine dimensional quality control with material quality control in one single quality inspection run.

Original language	English
Journal	C I R P Annals
Volume	60
Issue number	2
Pages (from-to)	821-842
ISSN	0007-8506
DOIs	https://doi.org/10.1016/j.cirp.2011.05.006
Publication status	Published - 2011

Keywords

Quality control
Metrology
X-ray computed tomography (CT)

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10.1016/j.cirp.2011.05.006

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title = "Computed tomography for dimensional metrology",

abstract = "The paper gives a survey of the upcoming use of X-ray computed tomography (CT) for dimensional quality control purposes: i.e. for traceable measurement of dimensions of technical (mechanical) components and for tolerance verification of such components. It describes the basic principles of CT metrology, putting emphasis on issues as accuracy, traceability to the unit of length (the meter) and measurement uncertainty. It provides a state of the art (anno 2011) and application examples, showing the aptitude of CT metrology to: (i) check internal dimensions that cannot be measured using traditional coordinate measuring machines and (ii) combine dimensional quality control with material quality control in one single quality inspection run.",

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AU - Kruth, J.P.

AU - Bartscher, M.

AU - Carmignato, S.

AU - Schmitt, R.

AU - De Chiffre, Leonardo

AU - Weckenmann, A.

PY - 2011

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AB - The paper gives a survey of the upcoming use of X-ray computed tomography (CT) for dimensional quality control purposes: i.e. for traceable measurement of dimensions of technical (mechanical) components and for tolerance verification of such components. It describes the basic principles of CT metrology, putting emphasis on issues as accuracy, traceability to the unit of length (the meter) and measurement uncertainty. It provides a state of the art (anno 2011) and application examples, showing the aptitude of CT metrology to: (i) check internal dimensions that cannot be measured using traditional coordinate measuring machines and (ii) combine dimensional quality control with material quality control in one single quality inspection run.

KW - Quality control

KW - Metrology

KW - X-ray computed tomography (CT)

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DO - 10.1016/j.cirp.2011.05.006

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JO - C I R P Annals

JF - C I R P Annals

IS - 2

ER -

Computed tomography for dimensional metrology

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Keywords

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