Computed tomography for dimensional metrology

J.P. Kruth, M. Bartscher, S. Carmignato, R. Schmitt, Leonardo De Chiffre, A. Weckenmann

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

The paper gives a survey of the upcoming use of X-ray computed tomography (CT) for dimensional quality control purposes: i.e. for traceable measurement of dimensions of technical (mechanical) components and for tolerance verification of such components. It describes the basic principles of CT metrology, putting emphasis on issues as accuracy, traceability to the unit of length (the meter) and measurement uncertainty. It provides a state of the art (anno 2011) and application examples, showing the aptitude of CT metrology to: (i) check internal dimensions that cannot be measured using traditional coordinate measuring machines and (ii) combine dimensional quality control with material quality control in one single quality inspection run.
Original languageEnglish
JournalC I R P Annals
Volume60
Issue number2
Pages (from-to)821-842
ISSN0007-8506
DOIs
Publication statusPublished - 2011

Keywords

  • Quality control
  • Metrology
  • X-ray computed tomography (CT)

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