Component failures based on flaw distributions

Finn Jensen

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    Abstract

    A discussion is presented of a model based on the assumption that all failures basically are due to wearout. The only real difference between long-term wearout and the failures that occur in early life and during the useful life period will be in the size of the inherent flaws or defects in the components. Large flaws connect with early life failures, small flaws connect with end-of-life-failures. The model takes several competing failure mechanisms into account. Examples and case studies are used to provide substance to the model
    Original languageEnglish
    Title of host publicationProceedings of the Annual Reliability and Maintainability Symposium
    PublisherIEEE
    Publication date1989
    Pages91-95
    DOIs
    Publication statusPublished - 1989
    EventAnnual Reliability and Maintainability Symposium - Atlanta, GA
    Duration: 1 Jan 1989 → …

    Conference

    ConferenceAnnual Reliability and Maintainability Symposium
    CityAtlanta, GA
    Period01/01/1989 → …

    Bibliographical note

    Copyright 1989 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.

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