Complete deformaton analysis of transparent samples using digital shearography and holography

Francesca Celine I. Catalan, Raphael D. Santos, Percival Almoro

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Original languageEnglish
Title of host publication9. International symposium on laser metrology
EditorsC. Quan, A. Asundi
VolumePt. 1-2
Place of PublicationBellingham
PublisherSPIE - International Society for Optical Engineering
Publication date2008
Pages15536-15536
Publication statusPublished - 2008
Event9th International Symposium on Laser Metrology - Singapore, Singapore
Duration: 20 Jun 20082 Jul 2008
Conference number: 9

Conference

Conference9th International Symposium on Laser Metrology
Number9
CountrySingapore
CitySingapore
Period20/06/200802/07/2008
SeriesSPIE Proceedings Series, 7155

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