Complete deformaton analysis of transparent samples using digital shearography and holography

Francesca Celine I. Catalan; Raphael D. Santos; Percival Almoro

Complete deformaton analysis of transparent samples using digital shearography and holography

Francesca Celine I. Catalan, Raphael D. Santos, Percival Almoro

University of the Philippines Diliman

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

Original language	English
Title of host publication	9. International symposium on laser metrology
Editors	C. Quan, A. Asundi
Volume	Pt. 1-2
Place of Publication	Bellingham
Publisher	SPIE - International Society for Optical Engineering
Publication date	2008
Pages	15536-15536
Publication status	Published - 2008
Event	9th International Symposium on Laser Metrology - Singapore, Singapore Duration: 20 Jun 2008 → 2 Jul 2008 Conference number: 9

Conference

Conference	9th International Symposium on Laser Metrology
Number	9
Country/Territory	Singapore
City	Singapore
Period	20/06/2008 → 02/07/2008

Series	SPIE Proceedings Series, 7155

OpenUrl availability

Full text

Cite this

Catalan, Francesca Celine I. ; Santos, Raphael D. ; Almoro, Percival. / Complete deformaton analysis of transparent samples using digital shearography and holography. 9. International symposium on laser metrology. editor / C. Quan ; A. Asundi. Vol. Pt. 1-2 Bellingham : SPIE - International Society for Optical Engineering, 2008. pp. 15536-15536 (SPIE Proceedings Series, 7155).

@inproceedings{bc4d05d32fa24b61ac50c17f1cb583a8,

title = "Complete deformaton analysis of transparent samples using digital shearography and holography",

author = "Catalan, {Francesca Celine I.} and Santos, {Raphael D.} and Percival Almoro",

year = "2008",

language = "English",

volume = "Pt. 1-2",

series = "SPIE Proceedings Series, 7155",

pages = "15536--15536",

editor = "C. Quan and A. Asundi",

booktitle = "9. International symposium on laser metrology",

publisher = "SPIE - International Society for Optical Engineering",

note = "9th International Symposium on Laser Metrology ; Conference date: 20-06-2008 Through 02-07-2008",

}

Catalan, FCI, Santos, RD & Almoro, P 2008, Complete deformaton analysis of transparent samples using digital shearography and holography. in C Quan & A Asundi (eds), 9. International symposium on laser metrology. vol. Pt. 1-2, SPIE - International Society for Optical Engineering, Bellingham, SPIE Proceedings Series, 7155, pp. 15536-15536, 9th International Symposium on Laser Metrology, Singapore, Singapore, 20/06/2008.

Complete deformaton analysis of transparent samples using digital shearography and holography. / Catalan, Francesca Celine I.; Santos, Raphael D.; Almoro, Percival.
9. International symposium on laser metrology. ed. / C. Quan; A. Asundi. Vol. Pt. 1-2 Bellingham: SPIE - International Society for Optical Engineering, 2008. p. 15536-15536 (SPIE Proceedings Series, 7155).

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

TY - GEN

T1 - Complete deformaton analysis of transparent samples using digital shearography and holography

AU - Catalan, Francesca Celine I.

AU - Santos, Raphael D.

AU - Almoro, Percival

N1 - Conference code: 9

PY - 2008

Y1 - 2008

M3 - Article in proceedings

VL - Pt. 1-2

T3 - SPIE Proceedings Series, 7155

SP - 15536

EP - 15536

BT - 9. International symposium on laser metrology

A2 - Quan, C.

A2 - Asundi, A.

PB - SPIE - International Society for Optical Engineering

CY - Bellingham

T2 - 9th International Symposium on Laser Metrology

Y2 - 20 June 2008 through 2 July 2008

ER -