@inproceedings{be2375bae9a4492781733007ac65d441,
title = "Complementary microstructural characterization by scanning and transmission electron microscopy",
keywords = "Industrielle materialer",
author = "M.T. Lyttle",
year = "1998",
language = "English",
isbn = "87-550-2399-1",
pages = "355--360",
editor = "J.V. Carstensen and T. Leffers and T. Lorentzen and O.B. Pedersen and B.F. S{\o}rensen and G. Winther",
booktitle = "Modelling of structure and mechanics of materials from microscale to product. Proceedings",
publisher = "Ris{\o} National Laboratory",
note = "19th Ris{\o} International Symposium on Materials Science ; Conference date: 07-09-1998 Through 11-09-1998",
}