Complementary electron microscopic-spectroscopic characterization of Ti and Cr adhesion layers

Matteo Todeschini; Alice Bastos da Silva Fanta; Jakob Birkedal Wagner; Flemming Jensen; Anpan Han

Complementary electron microscopic-spectroscopic characterization of Ti and Cr adhesion layers

Matteo Todeschini, Alice Bastos da Silva Fanta, Jakob Birkedal Wagner, Flemming Jensen, Anpan Han

Research output: Contribution to conference › Conference abstract for conference › Research › peer-review

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Original language	English
Publication date	2017
Publication status	Published - 2017
Event	43rd International conference on Micro and Nano Engineering - Braga, Portugal Duration: 18 Sept 2017 → 22 Sept 2017 Conference number: 43

Conference

Conference	43rd International conference on Micro and Nano Engineering
Number	43
Country/Territory	Portugal
City	Braga
Period	18/09/2017 → 22/09/2017

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For poster presentation

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@conference{bad3569824aa4754816a89ad3d5af9c4,

title = "Complementary electron microscopic-spectroscopic characterization of Ti and Cr adhesion layers",

author = "Matteo Todeschini and {Bastos da Silva Fanta}, Alice and Wagner, {Jakob Birkedal} and Flemming Jensen and Anpan Han",

note = "For poster presentation; 43rd International conference on Micro and Nano Engineering, MNE 2017 ; Conference date: 18-09-2017 Through 22-09-2017",

year = "2017",

language = "English",

}

Complementary electron microscopic-spectroscopic characterization of Ti and Cr adhesion layers. / Todeschini, Matteo; Bastos da Silva Fanta, Alice ; Wagner, Jakob Birkedal et al.
2017. Abstract from 43rd International conference on Micro and Nano Engineering, Braga, Portugal.

Research output: Contribution to conference › Conference abstract for conference › Research › peer-review

TY - ABST

T1 - Complementary electron microscopic-spectroscopic characterization of Ti and Cr adhesion layers

AU - Todeschini, Matteo

AU - Bastos da Silva Fanta, Alice

AU - Wagner, Jakob Birkedal

AU - Jensen, Flemming

AU - Han, Anpan

N1 - Conference code: 43

PY - 2017

Y1 - 2017

M3 - Conference abstract for conference

T2 - 43rd International conference on Micro and Nano Engineering

Y2 - 18 September 2017 through 22 September 2017

ER -