Compensation of gain saturation in SOA-gates by interferometric Mach-Zehnder wavelength converters

Søren Lykke Danielsen, Carsten Jørgensen, Peter Bukhave Hansen, Benny Mikkelsen, Kristian Stubkjær, M. Schilling, K. Daub, K. Dütting, M. Klenk, W. Idler, P. Doussiere, F. Pommerau

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

72 Downloads (Pure)

Abstract

Compensation of signal degradation in semiconductor optical amplifier (SOA) gates for optical switch nodes using all-active integrated Mach-Zehnder interferometric wavelength converters is experimentally demonstrated at 2.5 and 10 Gb/s. More than 10 dB improvement of the dynamic range is obtained compared to a stand-alone SOA-gate.
Original languageEnglish
Title of host publicationOptical Communication, 1996. ECOC '96. 22nd European Conference on
Volume4
PublisherIEEE
Publication date1996
Pages45-48
ISBN (Print)82-423-0418-1
Publication statusPublished - 1996
Event22nd European Conference on Optical Communication - Oslo, Norway
Duration: 15 Sep 199619 Sep 1996
Conference number: 22
http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5806

Conference

Conference22nd European Conference on Optical Communication
Number22
CountryNorway
CityOslo
Period15/09/199619/09/1996
Internet address

Bibliographical note

Copyright: 1996 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE

Cite this

Danielsen, S. L., Jørgensen, C., Hansen, P. B., Mikkelsen, B., Stubkjær, K., Schilling, M., Daub, K., Dütting, K., Klenk, M., Idler, W., Doussiere, P., & Pommerau, F. (1996). Compensation of gain saturation in SOA-gates by interferometric Mach-Zehnder wavelength converters. In Optical Communication, 1996. ECOC '96. 22nd European Conference on (Vol. 4, pp. 45-48). IEEE.