Comparison of experimental techniques for characterization of through-thickness texture variations

For the investigation of through-thickness texture gradients, a number of layers in rolled plates and sheets are inspected. Crystallographic textures in different layers can be characterized using several techniques. In the present work, traditional low-energy X-ray diffraction, the electron backscattering pattern technique in the scanning electron microscope and a novel technique which involves high energy synchrotron radiation are used for characterization of through-thickness texture variations in commercial purity cold-rolled aluminium. Important experimental aspects of these three techniques are described. The results from the three techniques are compared and their potentials for characterization of through-thickness texture variations are considered.