Abstract
For the investigation of through-thickness texture gradients, a number of layers in rolled plates and sheets are inspected. Crystallographic textures in different layers can be characterized using several techniques. In the present work, traditional low-energy X-ray diffraction, the electron backscattering pattern technique in the scanning electron microscope and a novel technique which involves high energy synchrotron radiation are used for characterization of through-thickness texture variations in commercial purity cold-rolled aluminium. Important experimental aspects of these three techniques are described. The results from the three techniques are compared and their potentials for characterization of through-thickness texture variations are considered.
Original language | English |
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Title of host publication | Proceedings of the twelfth International Conference on Textures of Materials |
Editors | J.A. Szpunar |
Place of Publication | Ottawa |
Publisher | NRC Research Press |
Publication date | 1999 |
Pages | 174-179 |
ISBN (Print) | 0-660-17789-7 |
Publication status | Published - 1999 |
Event | 12th International Conference on Textures of Materials - Montreal, Canada Duration: 9 Aug 1999 → 13 Aug 1999 Conference number: 12 |
Conference
Conference | 12th International Conference on Textures of Materials |
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Number | 12 |
Country/Territory | Canada |
City | Montreal |
Period | 09/08/1999 → 13/08/1999 |