Comparison of experimental techniques for characterization of through-thickness texture variations

Oleg Mishin, E.M. Lauridsen, N.C. Krieger Lassen, H.F. Poulsen, D. Juul Jensen, G. Brückner, B. Bay

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

    Abstract

    For the investigation of through-thickness texture gradients, a number of layers in rolled plates and sheets are inspected. Crystallographic textures in different layers can be characterized using several techniques. In the present work, traditional low-energy X-ray diffraction, the electron backscattering pattern technique in the scanning electron microscope and a novel technique which involves high energy synchrotron radiation are used for characterization of through-thickness texture variations in commercial purity cold-rolled aluminium. Important experimental aspects of these three techniques are described. The results from the three techniques are compared and their potentials for characterization of through-thickness texture variations are considered.
    Original languageEnglish
    Title of host publicationProceedings of the twelfth International Conference on Textures of Materials
    EditorsJ.A. Szpunar
    Place of PublicationOttawa
    PublisherNRC Research Press
    Publication date1999
    Pages174-179
    ISBN (Print)0-660-17789-7
    Publication statusPublished - 1999
    Event12th International Conference on Textures of Materials - Montreal, Canada
    Duration: 9 Aug 199913 Aug 1999
    Conference number: 12

    Conference

    Conference12th International Conference on Textures of Materials
    Number12
    Country/TerritoryCanada
    CityMontreal
    Period09/08/199913/08/1999

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