Color effects from scattering on random surface structures in dielectrics.

Jeppe Clausen; Alexander B Christiansen; Jørgen Garnæs; N. Asger Mortensen; Anders Kristensen

doi:10.1364/OE.20.004376

Color effects from scattering on random surface structures in dielectrics.

Jeppe Clausen
, Alexander B Christiansen
, Jørgen Garnæs
, N. Asger Mortensen
, Anders Kristensen

Research output: Contribution to journal › Journal article › Research › peer-review

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Abstract

We show that cheap large area color filters, based on surface scattering, can be fabricated in dielectric materials by replication of random structures in silicon. The specular transmittance of three different types of structures, corresponding to three different colors, have been characterized. The angle resolved scattering has been measured and compared to predictions based on the measured surface topography and by the use of non-paraxial scalar diffraction theory. From this it is shown that the color of the transmitted light can be predicted from the topography of the randomly textured surfaces.

Original language	English
Journal	Optics Express
Volume	20
Issue number	4
Pages (from-to)	4376-4381
ISSN	1094-4087
DOIs	https://doi.org/10.1364/OE.20.004376
Publication status	Published - 2012

Bibliographical note

This paper was published in Optics Express and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://www.opticsinfobase.org/oe/abstract.cfm?uri=oe-20-4-4376. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.

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title = "Color effects from scattering on random surface structures in dielectrics.",

abstract = "We show that cheap large area color filters, based on surface scattering, can be fabricated in dielectric materials by replication of random structures in silicon. The specular transmittance of three different types of structures, corresponding to three different colors, have been characterized. The angle resolved scattering has been measured and compared to predictions based on the measured surface topography and by the use of non-paraxial scalar diffraction theory. From this it is shown that the color of the transmitted light can be predicted from the topography of the randomly textured surfaces.",

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note = "This paper was published in Optics Express and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://www.opticsinfobase.org/oe/abstract.cfm?uri=oe-20-4-4376. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.",

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doi = "10.1364/OE.20.004376",

language = "English",

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AU - Clausen, Jeppe

AU - Christiansen, Alexander B

AU - Garnæs, Jørgen

AU - Mortensen, N. Asger

AU - Kristensen, Anders

N1 - This paper was published in Optics Express and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://www.opticsinfobase.org/oe/abstract.cfm?uri=oe-20-4-4376. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.

PY - 2012

Y1 - 2012

N2 - We show that cheap large area color filters, based on surface scattering, can be fabricated in dielectric materials by replication of random structures in silicon. The specular transmittance of three different types of structures, corresponding to three different colors, have been characterized. The angle resolved scattering has been measured and compared to predictions based on the measured surface topography and by the use of non-paraxial scalar diffraction theory. From this it is shown that the color of the transmitted light can be predicted from the topography of the randomly textured surfaces.

AB - We show that cheap large area color filters, based on surface scattering, can be fabricated in dielectric materials by replication of random structures in silicon. The specular transmittance of three different types of structures, corresponding to three different colors, have been characterized. The angle resolved scattering has been measured and compared to predictions based on the measured surface topography and by the use of non-paraxial scalar diffraction theory. From this it is shown that the color of the transmitted light can be predicted from the topography of the randomly textured surfaces.

U2 - 10.1364/OE.20.004376

DO - 10.1364/OE.20.004376

M3 - Journal article

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VL - 20

SP - 4376

EP - 4381

JO - Optics Express

JF - Optics Express

IS - 4

ER -

Color effects from scattering on random surface structures in dielectrics.

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