Coating process parameter influence on thin films for the ATHENA x-ray optics

S. Massahi, D. D. M. Ferreira, F. E. Christensen, S. Svendsen, N. Gellert, A. 'S Jegers, M. Collon, B. Landgraf, A. Thete, I. Ferreira, M. Bavdaz, B. Shortt, W. Schönberger, A. Langer, M. Krumrey, C. Gollwitzer, E. Handick

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Material Science

Engineering

Physics