Closed Loop Fault Detectability Based on a Gap-metric

André Krabdrup Sekunda, Steven Ding, Hans Henrik Niemann

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Abstract

Systems are often controlled using feedback loops. Fault diagnosis schemes are usually designed assuming that there is no feedback loop. Therefore fault diagnosis methods need to accommodate for the feedback loop. One such method is active fault diagnosis based on a fault signature system. This method is derived using the YJBK parametrisation, named after Youla, Jabr, Bongiorno and Kucera. It uses the derived fault signature system to determine the detectability of possible faults in the system. Deriving the fault signature system requires knowledge about the controller. This paper demonstrates the possibility of estimating the detectability of faults in the fault signature system using a gap-metric. The gap-metric has the advantage of only requiring knowledge about the plant. By using the gap-metric it is possible to estimate the detectability of faults without using information about the controller.
Original languageEnglish
Title of host publicationProceedings of 2018 IEEE Conference on Control Technology and Applications
PublisherIEEE
Publication date2018
Pages380-85
ISBN (Print)978-1-5386-7697-4
DOIs
Publication statusPublished - 2018
Event2018 IEEE Conference on Control Technology and Applications - Scandic Hotel, Copenhagen, Denmark
Duration: 21 Aug 201824 Aug 2018

Conference

Conference2018 IEEE Conference on Control Technology and Applications
LocationScandic Hotel
CountryDenmark
CityCopenhagen
Period21/08/201824/08/2018

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