Circuit analysis to predict humidity related failures in electronics - Methodology and recommendations

Salil Joshy*, Vadimas Verdingovas, Morten Stendahl Jellesen, Rajan Ambat

*Corresponding author for this work

Research output: Contribution to journalJournal articleResearchpeer-review

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Abstract

Aim of this paper is to demonstrate the use of circuit analysis to predict humidity robustness of an electronic circuit design. There is a lack of design tools which can predict failures due to humidity, especially the effect of humidity on electrical functionality of circuits. This work provides a methodology for utilising circuit simulation tools to detect humidity related faults associated with a circuit design by using experimentally determined leakage current data or surface insulation resistance using test pattern or model circuits. Simulation of circuits was performed with the experimentally determined SIR value as a parasitic resistance across two nodes of the circuit. Commonly used circuits such as a differential amplifier and a non-inverting comparator were analysed by this methodology. Based on the analysis, circuits with higher humidity robustness have been suggested as examples to demonstrate the effectiveness of this methodology. Finally, the correlation between the properties of the water layer on SIR pattern and actual components was done, which further demonstrates the applicability of the methodology.

Original languageEnglish
JournalMicroelectronics Reliability
Volume93
Pages (from-to)81-88
Number of pages8
ISSN0026-2714
DOIs
Publication statusPublished - 2019

Keywords

  • Contamination
  • Electronic circuit
  • Humidity
  • Leak current
  • Surface insulation resistance

Cite this

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title = "Circuit analysis to predict humidity related failures in electronics - Methodology and recommendations",
abstract = "Aim of this paper is to demonstrate the use of circuit analysis to predict humidity robustness of an electronic circuit design. There is a lack of design tools which can predict failures due to humidity, especially the effect of humidity on electrical functionality of circuits. This work provides a methodology for utilising circuit simulation tools to detect humidity related faults associated with a circuit design by using experimentally determined leakage current data or surface insulation resistance using test pattern or model circuits. Simulation of circuits was performed with the experimentally determined SIR value as a parasitic resistance across two nodes of the circuit. Commonly used circuits such as a differential amplifier and a non-inverting comparator were analysed by this methodology. Based on the analysis, circuits with higher humidity robustness have been suggested as examples to demonstrate the effectiveness of this methodology. Finally, the correlation between the properties of the water layer on SIR pattern and actual components was done, which further demonstrates the applicability of the methodology.",
keywords = "Contamination, Electronic circuit, Humidity, Leak current, Surface insulation resistance",
author = "Salil Joshy and Vadimas Verdingovas and Jellesen, {Morten Stendahl} and Rajan Ambat",
year = "2019",
doi = "10.1016/j.microrel.2018.12.010",
language = "English",
volume = "93",
pages = "81--88",
journal = "Microelectronics Reliability",
issn = "0026-2714",
publisher = "Pergamon Press",

}

Circuit analysis to predict humidity related failures in electronics - Methodology and recommendations. / Joshy, Salil; Verdingovas, Vadimas; Jellesen, Morten Stendahl; Ambat, Rajan.

In: Microelectronics Reliability, Vol. 93, 2019, p. 81-88.

Research output: Contribution to journalJournal articleResearchpeer-review

TY - JOUR

T1 - Circuit analysis to predict humidity related failures in electronics - Methodology and recommendations

AU - Joshy, Salil

AU - Verdingovas, Vadimas

AU - Jellesen, Morten Stendahl

AU - Ambat, Rajan

PY - 2019

Y1 - 2019

N2 - Aim of this paper is to demonstrate the use of circuit analysis to predict humidity robustness of an electronic circuit design. There is a lack of design tools which can predict failures due to humidity, especially the effect of humidity on electrical functionality of circuits. This work provides a methodology for utilising circuit simulation tools to detect humidity related faults associated with a circuit design by using experimentally determined leakage current data or surface insulation resistance using test pattern or model circuits. Simulation of circuits was performed with the experimentally determined SIR value as a parasitic resistance across two nodes of the circuit. Commonly used circuits such as a differential amplifier and a non-inverting comparator were analysed by this methodology. Based on the analysis, circuits with higher humidity robustness have been suggested as examples to demonstrate the effectiveness of this methodology. Finally, the correlation between the properties of the water layer on SIR pattern and actual components was done, which further demonstrates the applicability of the methodology.

AB - Aim of this paper is to demonstrate the use of circuit analysis to predict humidity robustness of an electronic circuit design. There is a lack of design tools which can predict failures due to humidity, especially the effect of humidity on electrical functionality of circuits. This work provides a methodology for utilising circuit simulation tools to detect humidity related faults associated with a circuit design by using experimentally determined leakage current data or surface insulation resistance using test pattern or model circuits. Simulation of circuits was performed with the experimentally determined SIR value as a parasitic resistance across two nodes of the circuit. Commonly used circuits such as a differential amplifier and a non-inverting comparator were analysed by this methodology. Based on the analysis, circuits with higher humidity robustness have been suggested as examples to demonstrate the effectiveness of this methodology. Finally, the correlation between the properties of the water layer on SIR pattern and actual components was done, which further demonstrates the applicability of the methodology.

KW - Contamination

KW - Electronic circuit

KW - Humidity

KW - Leak current

KW - Surface insulation resistance

U2 - 10.1016/j.microrel.2018.12.010

DO - 10.1016/j.microrel.2018.12.010

M3 - Journal article

VL - 93

SP - 81

EP - 88

JO - Microelectronics Reliability

JF - Microelectronics Reliability

SN - 0026-2714

ER -