Characterization of UV written waveguides with luminescence microscopy

Mikael Svalgaard; Anders Harpøth; Tue Rosbirk

Characterization of UV written waveguides with luminescence microscopy

Mikael Svalgaard, Anders Harpøth, Tue Rosbirk

Research output: Contribution to journal › Journal article › Research › peer-review

Abstract

Luminescence microscopy is used to measure the refractive index profile and molecular defect distribution of UV written waveguides with a spatial resolution of ~0.4 mm and high signal-to-noise ratio. The measurements reveal comlex waveguide formation dynamics with significant topological changes in the core profile. In addition, it is observed that thewaveguide formation process requires several milliseconds of UV exposure before starting.

Original language	English
Journal	Optics Express
Volume	13
Issue number	13
Pages (from-to)	5170-5178
ISSN	1094-4087
Publication status	Published - 2005

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title = "Characterization of UV written waveguides with luminescence microscopy",

abstract = "Luminescence microscopy is used to measure the refractive index profile and molecular defect distribution of UV written waveguides with a spatial resolution of ~0.4 mm and high signal-to-noise ratio. The measurements reveal comlex waveguide formation dynamics with significant topological changes in the core profile. In addition, it is observed that thewaveguide formation process requires several milliseconds of UV exposure before starting.",

author = "Mikael Svalgaard and Anders Harp{\o}th and Tue Rosbirk",

year = "2005",

language = "English",

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T1 - Characterization of UV written waveguides with luminescence microscopy

AU - Svalgaard, Mikael

AU - Harpøth, Anders

AU - Rosbirk, Tue

PY - 2005

Y1 - 2005

N2 - Luminescence microscopy is used to measure the refractive index profile and molecular defect distribution of UV written waveguides with a spatial resolution of ~0.4 mm and high signal-to-noise ratio. The measurements reveal comlex waveguide formation dynamics with significant topological changes in the core profile. In addition, it is observed that thewaveguide formation process requires several milliseconds of UV exposure before starting.

AB - Luminescence microscopy is used to measure the refractive index profile and molecular defect distribution of UV written waveguides with a spatial resolution of ~0.4 mm and high signal-to-noise ratio. The measurements reveal comlex waveguide formation dynamics with significant topological changes in the core profile. In addition, it is observed that thewaveguide formation process requires several milliseconds of UV exposure before starting.

M3 - Journal article

SN - 1094-4087

VL - 13

SP - 5170

EP - 5178

JO - Optics Express

JF - Optics Express

IS - 13

ER -

Characterization of UV written waveguides with luminescence microscopy

Abstract

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