Characterization of the JEM-2100F-LM TEM for Electron Holography and Magnetic Imaging

M. A. Schofield, Marco Beleggia, J. W. Lau, Y. Zhu

Research output: Contribution to journalJournal articleResearchpeer-review

Original languageEnglish
JournalJ E O L News
Volume42
Issue number1
ISSN1349-6832
Publication statusPublished - 2007
Externally publishedYes

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